Browsing Presentations by imec author "f24185b92f3f8a6e938e3a2b1f2a2e60238d691a"
Now showing items 1-20 of 24
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A 0.6 V 1.6 mW fully integrated voltage controlled oscillator in 90 nm CMOS aiming for the GPS L1 band
Aspemyr, Lars; Linten, Dimitri (2004) -
A 90nm RF CMOS technology supported by device modelling and circuit demonstrators
Ramos, Javier; Mercha, Abdelkarim; Jeamsaksiri, Wutthinan; Linten, Dimitri; Jenei, Snezana; Thijs, Steven; Scholten, Andries; Wambacq, Piet; Debusschere, Ingrid; Decoutere, Stefaan (2004) -
An insight into the effects induced by heavy-ion strikes in
Griffoni, Alessio; Thijs, Steven; Chen, Shih-Hung; Tazzoli, Augusto; Cordoni, Martina; Colombo, Paolo; Paccagnella, Alessandro; Linten, Dimitri; Groeseneken, Guido (2011) -
An integrated measurement set-up to study the impact of atmosphere on ESD in MEMS
Sangameswaran, Sandeep; De Coster, Jeroen; Cherman, Vladimir; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; De Wolf, Ingrid; Groeseneken, Guido (2010) -
Electrostatic discharge (ESD) protection for sub-90nm RFCMOS designs
Mahadeva Iyer, Natarajan; Linten, Dimitri; Groeseneken, Guido (2005) -
ESD characterization – standards, challenges and trends (Tutorial)
Scholz, Mirko; Thijs, Steven; Linten, Dimitri (2009) -
ESD data analysis software
Linten, Dimitri; Tremouilles, David (2010) -
ESD evaluation of 3D SIC technology using TSV
Thijs, Steven; Linten, Dimitri; Scholz, Mirko; Mercha, Abdelkarim; Van der Plas, Geert; Travaly, Youssef; Van Olmen, Jan; Groeseneken, Guido (2010) -
ESD issues in MEMS: a case study in micromirrors
Sangameswaran, Sandeep; De Coster, Jeroen; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Haspeslagh, Luc; Witvrouw, Ann; Van Hoof, Chris; Groeseneken, Guido; De Wolf, Ingrid (2008) -
ESD protection for wideband RFCMOS circuits – challenges, options, and trade-offs
Linten, Dimitri; Thijs, Steven; Natarajan, Mahadeva (2007) -
ESD-protection of advanced RF and broadband integrated circuits and MEMS
Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep (2010) -
Impact of CMOS Scaling and Technology Options on ESD Reliability
Mahadeva Iyer, Natarajan; Thijs, Steven; Vassilev, Vesselin; Tremouilles, David; Linten, Dimitri; Groeseneken, Guido (2005) -
Improved calibration method for VFTLP transients
Thijs, Steven; Linten, Dimitri; Sawada, Masanori; Groeseneken, Guido (2011) -
New opportunities in device scaling: How the high performing strained Ge pFINFET can help the space industry?
Mitard, Jerome; Witters, Liesbeth; Collaert, Nadine; Linten, Dimitri; Eneman, Geert; Claeys, Cor; Heyns, Marc; Mocuta, Anda; Thean, Aaron (2016) -
Relaxing the STT-MRAM reliability challenge by scaling MgO thickness
O'Sullivan, Barry; Van Beek, Simon; Roussel, Philippe; Rao, Siddharth; Kim, Woojin; Couet, Sebastien; Swerts, Johan; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
RF CMOS front end optimization
Jeamsaksiri, Wutthinan; Jurczak, Gosia; Rooyackers, Rita; Linten, Dimitri; Ramos, Javier (2003) -
RF CMOS front end optimization
Jeamsaksiri, Wutthinan; Jurczak, Gosia; Rooyackers, Rita; Linten, Dimitri; Ramos, Javier (2003) -
RF CMOS modelling for circuit design
Ramos, Javier; Mercha, Abdelkarim; Jeamsaksiri, Wutthinan; Linten, Dimitri; Jenei, Snezana; Thijs, Steven; Scholten, Andries; Wambacq, Piet; Debusschere, Ingrid; Decoutere, Stefaan (2004) -
RF CMOS: a designer's dream
Linten, Dimitri; Soens, Charlotte; Ryckwert, J.; Wambacq, Piet; Donnay, Stephane (2003) -
Self-protection capability of integrated power arrays
Vashchenko, Vladislav; Scholz, Mirko; Linten, Dimitri; Lafonteese, David; Thijs, Steven; Jansen, Philippe; Hopper, Peter; Groeseneken, Guido (2010)