Browsing Presentations by imec author "fd3930f7eb72d06dd561a45f72c18b5e5b997c0c"
Now showing items 1-16 of 16
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Arsenic-doped Ge-spiked monoemitter SiGe:C HBTs by means of low-temperature trisilane based epitaxy
You, Shuzhen; Decoutere, Stefaan; Nguyen, Duy; Van Huylenbroeck, Stefaan; Sibaja-Hernandez, Arturo; Venegas, Rafael; Loo, Roger; De Meyer, Kristin (2011) -
Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge pumping technique
Rosmeulen, Maarten; Breuil, Laurent; Lorenzini, Martino; Haspeslagh, Luc; Van Houdt, Jan; De Meyer, Kristin (2003) -
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility Transistors
Eneman, Geert; Simoen, Eddy; Delhougne, Romain; Gaubas, Eugenijus; Simons, Veerle; Roussel, Philippe; Verheyen, Peter; Lauwers, Anne; Loo, Roger; Vandervorst, Wilfried; De Meyer, Kristin; Claeys, Cor (2004) -
Distribution of fields and charge carriers in cylindrical and planar nanosize structures
Pokatilov, E. P.; Balaban, S. N.; Klimin, S. N.; Fomin, V. M.; Devreese, J. T.; Magnus, Wim; Van Rossum, Marc; De Meyer, Kristin; Schoenmaker, Wim (1998) -
Effective metal gate work function modification by ion implantation with W-based gate stack
Li, Zilan; Schram, Tom; Kerner, Christoph; Witters, Thomas; Singanamalla, Raghunath; Pourtois, Geoffrey; Paraschiv, Vasile; Hoffmann, Thomas Y.; Rohr, Erika; Absil, Philippe; De Gendt, Stefan; De Meyer, Kristin (2008) -
Integration of a composite SiO2HfO2 interpoly dielectric layer for low voltage polypoly erase in a 0.18μm HIMOSTM memory cell.
Blomme, Pieter; Haspeslagh, Luc; De Vos, Joeri; Lorenzini, Martino; Van Houdt, Jan; De Meyer, Kristin (2004) -
Integration of SPER and FUSI in a pFET
Severi, Simone; Pawlak, Bartek; Veloso, Anabela; Duffy, Ray; Kottantharayil, Anil; Lauwers, Anne; Henson, Kirklen; de Marneffe, Jean-Francois; Eyben, Pierre; Vandervorst, Wilfried; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2004) -
Novel devices on SOI: process integration and manufacturing challenges
De Meyer, Kristin (2004) -
Novel silicon device architectures
De Meyer, Kristin (2001) -
Physics based accurate extraction of Leff and Rs for deep submicron MOSFETs
De Meyer, Kristin (1999) -
Strained silicon SiGe HFETs for microwave applications
König, U.; Herzog, H.-J.; Aniel, F.; Kasper, E.; De Meyer, Kristin; Rabe, W.J.; Schumacher, H.; Thayne, I.; Parker, E.H.C. (2003) -
Surface termination of HfO2 in W/HfO2 gated metal-oxide-semiconductor stacks from thermal stability point of view
Li, Zilan; Pourtois, Geoffrey; Schram, Tom; De Gendt, Stefan; De Meyer, Kristin (2008) -
Threshold voltage model for deep-submicron fully-depleted SOI CMOS transistors including the effect of source/drain fringing fields into the buried oxide
van Meer, Hans; De Meyer, Kristin (2000) -
Tunnel field-effect transistors for low-power nano-electronics
Verhulst, Anne; Vandenberghe, William; Kao, Frank; Leonelli, Daniele; Rooyackers, Rita; Vandooren, Anne; Schulze, Andreas; Smets, Quentin; Soree, Bart; Magnus, Wim; De Meyer, Kristin; Vandervorst, Wilfried; Collaert, Nadine; Thean, Aaron; Heyns, Marc; Groeseneken, Guido (2012) -
Vespanntes SIGe für pMOS
Loo, Roger; Caymax, Matty; Collaert, Nadine; Verheyen, Peter; De Meyer, Kristin (2002)