Browsing Presentations by author "Kaczer, Ben"
Now showing items 21-31 of 31
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Non-linear dielectric constant increase with Ti composition in high-k ALD-HfTiOx films after O2 crystallization annealing
Tomida, Kazuyuki; Popovici, Mihaela Ioana; Opsomer, Karl; Menou, Nicolas; Delabie, Annelies; Swerts, Johan; Steenbergen, Johnny; Kaczer, Ben; Van Elshocht, Sven; Detavernier, Christophe; Wouters, Dirk; Kittl, Jorge (2009) -
Optimization of the ferroelectric film for application in scaled FeFET
Viapiana, Matteo; Xu, Zhen; Goux, Ludovic; Kaczer, Ben; Groeseneken, Guido; Wouters, Dirk (2004) -
Recent trends in CMOS front-end reliability (tutorial)
Kaczer, Ben (2011) -
Recent trends in CMOS reliability: from individual traps to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Grasser, Tibor; Roussel, Philippe; Camargo, Vinicius V. A.; Mahato, Swaraj; Simoen, Eddy; Wirth, Gilson I.; Groeseneken, Guido (2011) -
Recent trends in CMOS reliability: from individual traps to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Grasser, Tibor; Roussel, Philippe; Camargo, V. V. A.; Mahato, S.; Simoen, Eddy; Catthoor, Francky; Wirth, G. I.; Groeseneken, Guido (2012) -
Reliability aware design: from single defect physics to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Weckx, Pieter; Grasser, Tibor; Roussel, Philippe; Groeseneken, Guido (2012) -
Selection of ferroelectric/high-k gate stack combination for optimized FeFET performance
Xu, Zhen; Viapiana, Matteo; Kaczer, Ben; Goux, Ludovic; Groeseneken, Guido; Wouters, Dirk (2004) -
Stochastic piecewise modeling of post-BD gate current oriented to circuit design
Martin-Martinez, Javier; Kaczer, Ben; Ayala, N; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, X; Zuber, Paul; Dierickx, Bart (2008) -
The future of CMOS device reliability assessment: from individual traps to circuit simulations
Groeseneken, Guido; Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Roussel, Philippe (2012) -
The influence of recovery and temperature on the NBTI power-law exponent
Kaczer, Ben; Degraeve, Robin; Arkhipov, Vladimir; Collaert, Nadine; Groeseneken, Guido; Goodwin, Michael (2004) -
Workload-dependent BTI reliability evaluation of CMOS logic gates
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2012)