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Browsing by Author "Baeyens, Martien"

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    Alkaline cleaning of silicon wafers: additives for the prevention of metal contamination

    Martin Hoyas, Ana
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    Baeyens, Martien
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    Hub, W.
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    Mertens, Paul  
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    Kolbesen, B. O.
    Journal article
    1999, Microelectronic Engineering, (45) 2_3, p.197-208
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    Effect of metal contamination and improved cleaning strategies

    Mertens, Paul  
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    Bearda, Twan
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    Loewenstein, Lee
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    Martin, A.R.
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    Hub, W.
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    Kolbesen, B. O.
    Proceedings paper
    1999, Defects in Silicon III, 2/05/1999, p.401-413
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    Effect of metal contamination and improved cleaning strategies

    Mertens, Paul  
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    Bearda, Twan
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    Loewenstein, Lee
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    Martin, Andreas
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    Hub, Walter
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    Kolbesen, Bernd
    Proceedings paper
    1999, 6th International SCP Symposium "Meeting the Surface Preparation Challenges of the New Millennium", 10/05/1999
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    Evaluation of cleaning recipes based on ozonated water for pre-gate oxide cleaning

    Jeon, J. S.
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    Ogle, B.
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    Baeyens, Martien
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    Mertens, Paul  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.119-122
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    Evaluation of cleaning recipes based on ozonated water for pre-gate oxide cleaning

    Jeon, J. S.
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    Ogle, B.
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    Baeyens, Martien
    ;
    Mertens, Paul  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Fluorine in thermal oxides from HF preoxidation surface treatments

    Ruzyllo, Jerzy
    ;
    Röhr, Erika
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    Baeyens, Martien
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    Mertens, Paul  
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    Heyns, Marc  
    Journal article
    1999, Electrochemical and Solid State Letters, (2) 7, p.336-338
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    Gas-phase surface proessing prior to 3.2nm gate oxidation

    Ruzyllo, Jerzy
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    Röhr, Erika
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    Baeyens, Martien
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    Bearda, Twan
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    Mertens, Paul  
    ;
    Heyns, Marc  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Gas-phase surface proessing prior to 3.2nm gate oxidation

    Ruzyllo, Jerzy
    ;
    Röhr, Erika
    ;
    Baeyens, Martien
    ;
    Bearda, Twan
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.85-88
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    Hydrogen peroxide decomposition in ammonia solutions

    Knotter, D. M.
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    De Gendt, Stefan  
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    Baeyens, Martien
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Journal article
    1999, J. Electrochem. Soc., (146) 9, p.3476-3481
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    Hydrogen peroxide decomposition in ammonia solutions

    Knotter, D. M.
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    De Gendt, Stefan  
    ;
    Baeyens, Martien
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.15-18
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    Hydrogen peroxide decomposition in ammonin solutions

    Knotter, D. M.
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    De Gendt, Stefan  
    ;
    Baeyens, Martien
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Influence of frequency on the removal efficiency of nano-particles in a megasonic spray cleaning tool

    Schmidt, M.O.
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    Vereecke, Guy  
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    Vos, Rita  
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    Holsteyns, Frank  
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    Baeyens, Martien
    ;
    Mertens, Paul  
    Proceedings paper
    2003, Ultra Clean Processing of Silicon Surfaces 2002 - UCPSS, 16/09/2002, p.147-151
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    Influence of hardware and chemistry on the removal of nano-particles in a megasonic cleaning tank

    Vereecke, Guy  
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    Vos, Rita  
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    Holsteyns, Frank  
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    Schmidt, M.O.
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    Baeyens, Martien
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    Gomme, Steven
    Proceedings paper
    2003, Ultra Clean Processing of Silicon Surfaces 2002 - UCPSS, 16/09/2002, p.143-147
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    Quantitative modeling of H2O2 decomposition in SC1

    Mertens, Paul  
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    Baeyens, Martien
    ;
    Moyaerts, Gert
    ;
    Okorn-Schmidt, H. F.
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    Vos, Rita  
    ;
    De Waele, Rita
    Proceedings paper
    1998, Proceedings of the 5th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 31/08/1997, p.176-183
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    Role of UV/chlorine exposure during dry surface conditioning before integrated epi deposition process

    Ruzyllo, Jerzy
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    Röhr, Erika
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    Baeyens, Martien
    ;
    Conard, Thierry  
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    Mertens, Paul  
    ;
    Heyns, Marc  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Role of UV/chlorine exposure during dry surface conditioning before integrated epi deposition process

    Ruzyllo, Jerzy
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    Röhr, Erika
    ;
    Caymax, Matty  
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    Baeyens, Martien
    ;
    Conard, Thierry  
    ;
    Mertens, Paul  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.233-236
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    Silicon surface metal contamination measurements using grazing-emission XRF spectrometry

    De Gendt, Stefan  
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    Kenis, Karine  
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    Baeyens, Martien
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    Mertens, Paul  
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    Heyns, Marc  
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    Wiener, G.
    Proceedings paper
    1997, Science and Technology of Semiconductor Surface Preparation, 1/04/1997, p.397-402
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    Single step alkaline cleaning solution for advanced semiconductor cleaning

    Baeyens, Martien
    ;
    Hub, W.
    ;
    Kolbesen, B. O.
    ;
    Martin, A.R.
    ;
    Mertens, Paul  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Single step alkaline cleaning solution for advanced semiconductor cleaning

    Baeyens, Martien
    ;
    Hub, W.
    ;
    Kolbesen, B. O.
    ;
    Martin, A.R.
    ;
    Mertens, Paul  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.23-26

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