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Browsing by Author "Beyne, Eric"

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    10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process

    Derakhshandeh, Jaber  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
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    Inoue, Fumihiro  
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    De Preter, Inge  
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622
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    20 μm pitch Cu-to-Cu flip-chip interconnects through Cu nanoparticles sintering

    Ji, Xinrui
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    Du, Leiming
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    van Zeijl, Henk
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    Zhang, Guoqi
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    Derakhshandeh, Jaber  
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    Beyne, Eric  
    Proceedings paper
    2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.1891-1895
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    2D vs 3D integration: Architecture-technology co-design for future mobile MPSoC platforms

    Agrawal, Prashant  
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    Milojevic, Dragomir  
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    Raghavan, Praveen
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    Catthoor, Francky  
    Proceedings paper
    2014, IEEE International Interconnect Technology Conference - IITC, 20/05/2014, p.381-384
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    2x2 and 4x4 arrays of annular slot antennas in MCM-D technology fed by coplanar CPW networks

    Soliman, Ezzeldin
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    Brebels, Steven  
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    Beyne, Eric  
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    Vandenbosch, G. A. E.
    Journal article
    1999, IEE Proceedings - Microwaves, Antennas and Propagation, (146) 5, p.335-338
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    3-D technology assessment: path-finding the technology/design sweet-spot

    Marchal, Pol
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    Bougard, Bruno
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    Katti, Guruprasad
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    Stucchi, Michele  
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    Dehaene, Wim  
    Journal article
    2009, Proceedings of the IEEE, (97) 1, p.96-107
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    300mm wafer thinning and backside passivation compatibility with temporary wafer bonding for 3D stacked IC applications

    Jourdain, Anne  
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    Buisson, Thibault
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    Phommahaxay, Alain  
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    Privett, Marc
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    Wallace, Daniel
    Meeting abstract
    2010-11, IEEE International 3D System Integration Conference - 3DIC, 16/11/2010
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    3D

    Zhang, Wenqi
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    Limaye, Paresh
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    La Manna, Antonio  
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    Beyne, Eric  
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    Soussan, Philippe  
    Journal article
    2011, Semiconductor Manufacturing China, (12) 4, p.11-13
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    3D chip package interaction thermo-mechanical challenges: proximity effects of through silicon vias and μ-bumps

    Guo, Wei  
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    Van der Plas, Geert  
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    Ivankovic, Andrej
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    Eneman, Geert  
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    Cherman, Vladimir  
    Proceedings paper
    2012, IEEE International Conference on IC Design and technology - ICICDT, 30/05/2012
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    3D Embedding and interconnection of ultra thin (<20um) silicon dies

    Iker, Francois
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    Sabuncuoglu Tezcan, Deniz  
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    Cotrin Teixeira, Ricardo
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    Soussan, Philippe  
    Proceedings paper
    2007, 9th Electronics Packaging Technology Conference - EPTC, 10/12/2007, p.222-226
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    3D heterogeneous integration techniques for wireless devices

    De Raedt, Walter  
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    Brebels, Steven  
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    Soussan, Philippe  
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    Beyne, Eric  
    Oral presentation
    2010, RFIC Symposium Workshop M: RF Packaging Solutions for Wireless Communication Platforms
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    3D Heterogeneous Package Integration of Air/Magnetic Core Inductor: 89%-Efficiency Buck Converter with Backside Power Delivery Network

    Sun, Xiao  
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    Lin, Hesheng  
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    Velenis, Dimitrios  
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    Slabbekoorn, John  
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    Talmelli, Giacomo  
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    Bex, Pieter  
    Proceedings paper
    2020, IEEE Symposium on VLSI Technology and Circuits, JUN 15-19, 2020
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    3D heterogeneous system integration: Application driver for 3D technology development

    Beyne, Eric  
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    Marchal, Pol
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    Van der Plas, Geert  
    Proceedings paper
    2011, 48th ACM/EDAC/IEEE Design Automation Conference - DAC, 5/06/2011, p.213
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    3D IC assembly using thermal compression bonding and wafer-level underfill – strategies for quality improvement and throughput enhancement

    Wang, Teng
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    Bex, Pieter  
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    Capuz, Giovanni  
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    Duval, Fabrice  
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    Inoue, Fumihiro  
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    Gerets, Carine  
    Proceedings paper
    2016, IEEE 18th Electronic Packaging Technology Conference - EPTC, 30/11/2016, p.791-796
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    3D IC integration tutorial. Definitions and classifications

    Beyne, Eric  
    Oral presentation
    2009, IEEE International Conference on 3D System Integration - 3D IC
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    3D integration

    Beyne, Eric  
    Oral presentation
    2008, DATE Conference
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    3D integration - definitions, status and roadmap

    Beyne, Eric  
    Proceedings paper
    2014, 18th IEEE Workshop on Signal and Power Integrity - SPI, 11/05/2014
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    3D integration challenges and progress: from TSV to stacked die technologies

    Beyne, Eric  
    Oral presentation
    2011, IEEE-CPMT Orange County Chapter Seminar "3D Integrated Circuits: Technologies Enabling the Revolution"
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    3D integration challenges for fine pitch back side micro-bumping on ZoneBOND™ wafers

    Buisson, Thibault
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    De Preter, Inge  
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    Suhard, Samuel  
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    Vandersmissen, Kevin  
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    Jaenen, Patrick  
    Proceedings paper
    2012, 4th Electronics System Integration Technologies Conference - ESTC, 17/09/2012
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    3D integration technologies at IMEC

    Beyne, Eric  
    Book chapter
    2008
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    3D integration technology and the microelectronics supply chain: barriers and solutions

    Beyne, Eric  
    Proceedings paper
    2009, IMAPS Global Business Council, Spring Conference, 8/03/2009
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