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Browsing by Author "Clemente, Francesca"

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    A critical assessment of the synthesis of diameter and chirality controlled CNTs in zeolites

    Van Noyen, Jasper
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    Roeffaers, M.
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    De Cremer, G.
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    Vosch, T.
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    Hofkens, J.
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    Clemente, Francesca
    Proceedings paper
    2009, Graphene and Emerging Materials for Post-CMOS Applications, 24/05/2009, p.161-174
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    Accurate carrier profiling of n-type GaAs junctions

    Clarysse, Trudo
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    Brammertz, Guy  
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    Vanhaeren, Danielle  
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    Eyben, Pierre  
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    Goossens, Jozefien
    Journal article
    2008, Materials Science in Semiconductor Processing, (11) 5_6, p.259-266
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    Analysis and modeling of the high vacuum scanning spreading resistance microscopy nanocontact on silicon

    Eyben, Pierre  
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    Clemente, Francesca
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    Vanstreels, Kris  
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    Pourtois, Geoffrey  
    Journal article
    2010, Journal of Vacuum Science and Technology B, (28) 2, p.401-406
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    Analysis and modeling of the HV-SSRM nanocontact on silicon

    Eyben, Pierre  
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    Clemente, Francesca
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    Vanstreels, Kris  
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    Pourtois, Geoffrey  
    Meeting abstract
    2009, International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling, 26/04/2009
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    Bandgap opening in oxygen plasma-treated graphene

    Nourbakhsh, Amirhasan
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    Cantoro, Mirco
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    Vosch, Tom
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    Pourtois, Geoffrey  
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    Clemente, Francesca
    Journal article
    2010, Nanotechnology, (21) 43, p.435203
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    Benefits and side effects of high temperature anneal used to reduce threading dislocation defects in epitaxial Ge Layers on Si substrates

    Terzieva, Valentina  
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    Souriau, Laurent  
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    Caymax, Matty  
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    Brunco, David
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    Moussa, Alain  
    Journal article
    2008, Thin Solid Films, (517) 1, p.172-177
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    Capabilities and limitations of Raman spectroscopy for carbon nanotubes analysis in the micro- and nano-electronics framework

    Clemente, Francesca
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    Richard, Olivier  
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    Hantschel, Thomas  
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    Vandervorst, Wilfried  
    Oral presentation
    2007, 4th Intel Ireland Research Conference and Raman Workshop
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    Characterization of 248nm deep ultraviolet (DUV) photoresist after ion implantation

    Tsvetanova, Diana  
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    Vos, Rita  
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    Vereecke, Guy  
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    Clemente, Francesca
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    Vanstreels, Kris  
    Meeting abstract
    2009, 216th ECS Meeting, 4/10/2009, p.2077
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    Characterization of 248nm deep ultraviolet (DUV) photoresist after ion implantation

    Tsvetanova, Diana  
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    Vos, Rita  
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    Vereecke, Guy  
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    Clemente, Francesca
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    Vanstreels, Kris  
    Proceedings paper
    2009, Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing 11, 4/10/2009, p.187-194
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    Characterization of boron-doped diamond films for application in nanoscale electrical measurements

    Hantschel, Thomas  
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    Zimmer, Jerry
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    Moussa, Alain  
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    Olanterae, Lauri
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    Clemente, Francesca
    Proceedings paper
    2010, Hasselt Diamond Workshop - SBDD XV, 22/02/2010
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    Characterization of intragrain defects in polycrystalline silicon layers obtained by aluminum-induced crystallization and epitaxy

    Van Gestel, Dries
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    Gordon, Ivan  
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    Bender, Hugo  
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    Clemente, Francesca
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    Beaucarne, Guy
    Oral presentation
    2008, MRS Spring Meeting Symposium A: Amorphous and Polycrystalline Thin-Film Silicon Science and Technology
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    Controlled III/V nanowire growth by selective-area vapor-phase epitaxy

    Cantoro, Mirco
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    Brammertz, Guy  
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    Richard, Olivier  
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    Bender, Hugo  
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    Clemente, Francesca
    Journal article
    2009, Journal of the Electrochemical Society, (156) 11, p.H860-H868
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    Controlled III/V nanowire growth by selective-area vapour phase epitaxy

    Cantoro, Mirco
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    Brammertz, Guy  
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    Richard, Olivier  
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    Clemente, Francesca
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    Leys, Maarten
    Proceedings paper
    2009, Graphene and Emerging Materials for Post-CMOS Applications, 24/05/2009, p.309-329
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    Degradation of 248nm deep UV photoresist by ion implantation

    Tsvetanova, Diana  
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    Vos, Rita  
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    Vereecke, Guy  
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    Parac-Vogt, Tatjana
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    Clemente, Francesca
    Journal article
    2011, Journal of the Electrochemical Society, (158) 8, p.H785-H794
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    Direct evidence of high spatial localization of hot spots in surface-enhanced Raman scattering

    Chen, Chang
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    Hutchison, James
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    Clemente, Francesca
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    Kox, Ronald
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    Uji-I, Hironshi
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    Hofkens, Johan
    Journal article
    2009, Angewandte Chemie International Edition, (48) 52, p.9932-9935
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    Graphene for microelectronics

    van der Veen, Marleen  
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    Soree, Bart  
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    Cantoro, Mirco
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    Klekachev, Alexander
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    Nourbakhsh, Amirhasan
    Oral presentation
    2009, Graphene Workshop by The IAP-Phase VI
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    High Ge content SGOI substrates obtained by the Ge condensation technique: a template for growth of strained epitaxial Ge

    Souriau, Laurent  
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    Terzieva, Valentina  
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    Vandervorst, Wilfried  
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    Clemente, Francesca
    Journal article
    2008, Thin Solid Films, (517) 1, p.23-26
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    High Ge content SGOI substrates obtained by the Ge condensation technique:a template for growth of strained epitaxial Ge

    Souriau, Laurent  
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    Terzieva, Valentina  
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    Vandervorst, Wilfried  
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    Clemente, Francesca
    Proceedings paper
    2007, 5th International Conference on Silicon Epitaxy and Heterostructures - ICSI-5, 20/05/2007
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    Hydrogen and inert species in solid phase epitaxy

    Lieten, Ruben
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    Degroote, Stefan
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    Clemente, Francesca
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    Leys, Maarten
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    Borghs, Gustaaf  
    Journal article
    2010, Applied Physics Letters, (96) 5, p.52109
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    Intrinsic localization property of SERS demonstrated by electron beam induced deposition

    Chen, Chang
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    Van Dorpe, Pol  
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    Hutchison, James
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    Clemente, Francesca
    ;
    Kox, Ronald
    ;
    UJi-i, Hiroshi
    Oral presentation
    2009, 35th International Conference on Micro & Nano Engineering - MNE
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