Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Dauendorffer, Arnaud"

Filter results by typing the first few letters
Now showing 1 - 5 of 5
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Approaches to Enable Patterning of Tight Pitches towards High NA EUV

    Tadatomo, Hiroki
    ;
    Dauendorffer, Arnaud
    ;
    Onitsuka, Tomoya
    ;
    Genjima, Hisashi
    ;
    Ido, Yasuyuki
    Proceedings paper
    2022, Conference on Advanced Etch Technology and Process Integration for Nanopatterning XI Part of SPIE Advanced Lithography and Patterning Conference, APR 24-MAY 27, 2020-2022, p.120560F
  • Loading...
    Thumbnail Image
    Publication

    Elucidating the role of imaging metrics for variability and after etch defectivity

    Franke, Joern-Holger
    ;
    Frommhold, Andreas  
    ;
    Dauendorffer, Arnaud
    ;
    Nafus, Kathleen
    Journal article
    2022, JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3, (21) 2, p.Art. 023201
  • Loading...
    Thumbnail Image
    Publication

    EUV Metal Oxide Resist Development Technology for Improved Sensitivity, Roughness and Pattern Collapse Margin for High Volume Manufacturing

    Dinh, Cong Que
    ;
    Nagahara, Seiji
    ;
    Kuwahara, Yuhei
    ;
    Dauendorffer, Arnaud
    ;
    Yoshida, Keisuke
    Journal article
    2022, JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, (35) 1, p.87-93
  • Loading...
    Thumbnail Image
    Publication

    Novel processing technologies for advanced EUV patterning materials using metal oxide resist (MOR)

    Onitsuka, Tomoya
    ;
    Kawakami, Shinichiro
    ;
    Dauendorffer, Arnaud
    ;
    Shimura, Satoru
    Proceedings paper
    2021, Conference on Extreme Ultraviolet (EUV) Lithography XII, FEB 22-26, 2021, p.116091L
  • Loading...
    Thumbnail Image
    Publication

    Recent advances in EUV patterning in preparation towards high-NA EUV

    Nagahara, Seiji
    ;
    Dauendorffer, Arnaud  
    ;
    Thiam, Arame  
    ;
    Liu, Xiang  
    ;
    Kuwahara, Yuhei
    ;
    Dinh, Cong Que
    Proceedings paper
    2023, Conference on Advances in Patterning Materials and Processes XL, FEB 27-MAR 01, 2023, p.Art. 124981G

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings