Browsing by Author "Gerardin, S."

A statistical approach to microdose induced degradation in FinFET devices

Dynamic-ron control via proton irradiation in AlGaN/GaN transistors

Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques

Electrical stresses on ultra-thin gate oxide SOI MOSFETs after irradiation

Electrostatic discharge effects in fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques

ESD sensitivity of 65-nm fully depleted SOI MOSFETs with different strain-inducing techniques

Impact of radiation on the operation and reliability of deep submicron CMOS technologies

Microdose and breakdown effects induced by heavy ions on sub 20-nm triple gate SOI FETs