Browsing by Author "Goossens, Kees"
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Publication Application of cell-aware test on an advanced 3nm CMOS standard-cell library
Proceedings paper2019-05, CDNLive EMEA 2019, 6/05/2019Publication Application of cell-aware test on an advanced 3nm CMOS technology library
; ; ; Publication Bandwidth analysis of functional interconnects used as test access mechanism
Journal article2010-07, Journal of Electronic Testing, (26) 4, p.453-464Publication Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology
; ; ; Publication Cell-aware test:significant test quality improvement at affordable cost
Proceedings paper2018-05, CDN Live EMEA, 7/05/2018Publication Defect location identification for cell-aware test
Proceedings paper2019-07, IEEE International Test Conference India (ITC-India) 2019, 21/07/2019Publication Defect-location identification for cell-aware test
Proceedings paper2019-03, IEEE Latin-American Test Symposium (LATS'19), 11/03/2019, p.1-6Publication Gate-level power analysis of on-chip communication infrastructures for biomedical applications
Publication Optimizing cell-aware ATPG using defect detection matrices
Proceedings paper2019-07, IEEE International Test Conference India (ITC-India) 2019, 21/07/2019Publication Optimizing of cell-aware ATPG results by manipulating library cells' defect detection matrices
Proceedings paper2019-09, IEEE International Test Conference Asia (ITC-Asia), 3/09/2019, p.1-6Publication Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality
Journal article2021-04-01, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, (37) 2, p.161-189Publication Testing for internal defects in library cells
Proceedings paper2017-05, ICT.OPEN, 21/03/2017Publication Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults
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