Browsing by Author "Gorchichko, Mariia"
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Publication 3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs
;Reaz, Mahmud ;Tonigan, Andrew M. ;Li, Kan ;Smith, M. Brandon ;Rony, Mohammed W.Gorchichko, MariiaJournal article2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 5, p.2556-2563Publication Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs
Proceedings paper2020, Nuclear & Space Radiation Effects Conference - NSREC, 20/07/2020, p.PC-6Publication Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
;Li, Kan ;Zhang, En Xia ;Gorchichko, Mariia ;Wang, Peng Fei ;Reaz, MahmudZhao, Simeng E.Journal article2021, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (68) 5, p.740-747Publication Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
Journal article2023, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (70) 4, p.442-448Publication TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
;Bonaldo, Stefano ;Gorchichko, Mariia ;Zhang, En Xia ;Ma, Teng ;Mattiazzo, SerenaBagatin, MartaJournal article2022, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (69) 7, p.1444-1452Publication Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors
;Gorchichko, Mariia ;Zhang, En Xia ;Wang, Pan ;Bonaldo, StefanoSchrimpf, Ronald D.Journal article2021, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (68) 5, p.687-696