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Browsing by Author "Hatcher, Z."

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    Advanced single chemistry alkaline cleaning in a STEAG single tank tool

    Onsia, Bart  
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    Schellkes, E.
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    Vos, Rita  
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    De Gendt, Stefan  
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    Doll, O.
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    Fester, A.
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    Kolbesen, B. O.
    Meeting abstract
    2001, 200th Meeting of the Electrochemical Society: 7th International Symposium on Cleaning Technology in Semiconductor Device Manufac, 2/09/2001
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    Advanced single chemistry alkaline cleaning in a STEAG single tank tool

    Onsia, Bart  
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    Schellkes, E.
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    Vos, Rita  
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    De Gendt, Stefan  
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    Doll, O.
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    Fester, A.
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    Kolbesen, B.
    Proceedings paper
    2002, Cleaning Technology in Semiconductor Device Manufacturing VII, 4/09/2001, p.23-30
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    Cleaning technology for highly reliable gate oxides

    Heyns, Marc  
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    Meuris, Marc  
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    Verhaverbeke, Steven
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    Mertens, Paul  
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    Schmidt, Harald
    Proceedings paper
    1994, Proceedings of the International Conference on Advanced Microelectronic Devices and Processing - AMDP, 03/03/1994, p.59-66
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    Corrosion of aluminum alloys during drying of metallized wafers

    Vos, Rita  
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    Meuris, Marc  
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    Mertens, Paul  
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    Heyns, Marc  
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    Hatcher, Z.
    Proceedings paper
    1998, Proceedings of the 5th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 31/08/1997, p.569-578
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    H2O2 decomposition and its impact on silicon surface roughening and gate oxide integrity

    Schmidt, Harald
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    Meuris, Marc  
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    Rotondaro, Antonio
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    Heyns, Marc  
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    Hurd, Trace
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    Hatcher, Z.
    Journal article
    1995, Japanese Journal of Applied Physics. Part 1, (34) 2B, p.727-731
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    Improved phosphoric acid mixtures for nitride strip

    Vos, Rita  
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    Lux, Marcel  
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    Conard, Thierry  
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    De Witte, Hilde
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    Mertens, Paul  
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    Heyns, Marc  
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    Hatcher, Z.
    Proceedings paper
    2001, Ultra Clean Processing of Silicon Surfaces 2000: Proceedings of the 5th International Conference - UCPSS, 18/09/2000, p.43-46
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    Just-Clean- Enough technology for the 21st century

    Heyns, Marc  
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    Meuris, Marc  
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    Mertens, Paul  
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    Hurd, Trace
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    Schmidt, Harald
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    Depas, Michel
    Oral presentation
    1995, SEMICON Europe
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    Physico chemical aspects of hydrogen peroxide based silicon wafer cleaning solutions

    Schmidt, Harald
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    Meuris, Marc  
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    Mertens, Paul  
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    Rotondaro, Antonio
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    Heyns, Marc  
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    Hurd, Trace
    Proceedings paper
    1994, Proceedings of the 2nd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS, 19/09/1994, p.259-266
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    Quantitative modeling of H2O2 decomposition in SC1

    Mertens, Paul  
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    Baeyens, Martien
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    Moyaerts, Gert
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    Okorn-Schmidt, H. F.
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    Vos, Rita  
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    De Waele, Rita
    Proceedings paper
    1998, Proceedings of the 5th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 31/08/1997, p.176-183
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    Removal of submicrometer particles from silicon wafer surfaces using HF-based cleaning mixtures

    Vos, Rita  
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    Lux, Marcel  
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    Xu, Kaidong
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    Fyen, Wim
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    Kenens, Conny
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    Conard, Thierry  
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    Mertens, Paul  
    Journal article
    2001, Journal of the Electrochemical Society, (148) 12, p.G683-G691
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    Single chemistry cleaning solution for advanced wafer cleaning

    Vos, Rita  
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    Doll, O.
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    Fester, A.
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    Kolbesen, B. O.
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    Lux, Marcel  
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    Kenis, Karine  
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    Onsia, Bart  
    Proceedings paper
    2001, Ultra Clean Processing of Silicon Surfaces 2000: Proceedings of the 5th International Conference - UCPSS, 18/09/2000, p.119-122
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    The importance of H2O2 decomposition in silicon surface cleaning

    Schmidt, Harald
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    Meuris, Marc  
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    Mertens, Paul  
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    Rotondaro, Antonio
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    Heyns, Marc  
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    Hurd, Trace
    Proceedings paper
    1994, Extended Abstracts of the International Conference on Solid State Devices and Materials - SSDM, 23/08/1994, p.419-421
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    Ultra Clean Processing Technologies: Advanced Si-Surface Preparation Techniques

    Heyns, Marc  
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    Meuris, Marc  
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    Mertens, Paul  
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    Hurd, Trace
    ;
    Schmidt, Harald
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    Verhaverbeke, Steven
    Proceedings paper
    1994, Isolators and Minienvironments. Scottish Society for Contamination Control; November 9, 1994; Glasgow, UK., p.38-48
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    Ultra clean processing technologies: advanced si-surface preparation techniques

    Heyns, Marc  
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    Meuris, Marc  
    ;
    Mertens, Paul  
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    Hurd, Trace
    ;
    Schmidt, Harald
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    Verhaverbeke, Steven
    Proceedings paper
    1994, Technical Conference SEMICON / Europe, 12/04/1994
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    Ultra clean processing technology for highly reliable gate oxides

    Heyns, Marc  
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    Meuris, Marc  
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    Mertens, Paul  
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    Schmidt, Harald
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    Verhaverbeke, Steven
    ;
    Bender, Hugo  
    Proceedings paper
    1994, Proceedings of the Institute of Environmental Science: 40th Annual Technical Meeting, 01/05/1994, p.200-209
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    Use of surfactants for improved particle performance of dHF-based cleaning recipes

    Vos, Rita  
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    Xu, Kaidong
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    Lux, Marcel  
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    Fyen, Wim
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    Singh, R.
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    Chen, Zhi Yong
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    Mertens, Paul  
    ;
    Hatcher, Z.
    Proceedings paper
    2001, Ultra Clean Processing of Silicon Surfaces 2000: Proceedings of the 5th International Conference - UCPSS, 18/09/2000, p.263-266

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