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Browsing by Author "Kim, Woojin"

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    A Co/Ni-based perpendicular magnetic tunnel junction (p-MTJ) stack with improved reference layer for BEOL compatibility

    Tomczak, Yoann  
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    Lin, Tsann
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    Swerts, Johan  
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    Couet, Sebastien  
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    Mertens, Sofie  
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    Liu, Enlong
    Meeting abstract
    2016, MMM Intermag, 11/01/2016
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    A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays

    Kim, Woojin  
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    Pica, Valerio  
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    Jossart, Nico  
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    Yasin, Farrukh  
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    Wostyn, Kurt  
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    Couet, Sebastien  
    Proceedings paper
    2024, International Memory Workshop (IMW), MAY 12-15, 2024
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    BEOL compatible double-MTJ STT-MRAM for ultra-low write-currents

    Carpenter, Robert  
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    Rao, Siddharth  
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    Couet, Sebastien  
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    Kim, Woojin  
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    Swerts, Johan  
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    Crotti, Davide  
    Meeting abstract
    2020, Intermag 2020, 4/05/2020, p.GC-05
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    BEOL compatible top pinned magnetic tunnel junctions with a synthetic ferromagnetic pinning layer design

    Swerts, Johan  
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    Liu, Enlong
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    Couet, Sebastien  
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    Mertens, Sofie  
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    Carpenter, Robert  
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    Kim, Woojin  
    Meeting abstract
    2018, Joint European Magnetic Symposia. 9th JEMS Conference, 3/09/2018, p.SP4.2.06
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    BEOLC compatiblehigh tunnel magneto resistance perpendicula magnetic tunnel junctions using a sacrificial Mg layer as CoFeB free layer cap

    Swerts, Johan  
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    Mertens, Sofie  
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    Lin, Tsann
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    Couet, Sebastien  
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    Tomczak, Yoann  
    Journal article
    2015, Applied Physics Letters, (106) 26, p.262407
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    CMP process steps for the fabrication of spin-transfer torque magnetic random access memory

    Tsvetanova, Diana  
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    Heylen, Nancy  
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    Teugels, Lieve  
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    Crotti, Davide  
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    Donadio, Gabriele Luca  
    Proceedings paper
    2016, 20th International Symposium on CMP at CAMP, 7/08/2016
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    Co/Ni based p-MTJ stack for sub-20nm high density stand alone and high performance embedded memory application

    Kar, Gouri Sankar  
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    Kim, Woojin  
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    Tahmasebi, Taiebeh
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    Swerts, Johan  
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    Mertens, Sofie  
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    Heylen, Nancy  
    Proceedings paper
    2014, International Electron Devices Meeting - IEDM, 15/12/2014, p.478-481
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    Cross-layer design and analysis of al ow power, high density STT-MRAM for embedded systems

    Perumkunnil, Manu  
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    Sakhare, Sushil
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    Huynh Bao, Trong
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    Rao, Siddharth  
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    Kim, Woojin  
    Proceedings paper
    2017, 2017 IEEE International Symposium of Circuits and Systems - ISCAS, 28/05/2017, p.1-4
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    Cryogenic cooling post MgO promoting the free layer coercivity and TMR in perpendicular bottom pinned Co/Ni STT-MRAM device stacks

    Swerts, Johan  
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    Mertens, Sofie  
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    Couet, Sebastien  
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    Lin, Tsann
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    Liu, Enlong
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    Rao, Siddharth  
    Meeting abstract
    2016, 61st Annual Conference on Magnetism and Magnetic Materials, 31/10/2016
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    Demonstration of a Free-layer Developed With Atomistic Simulations Enabling BEOL Compatible VCMA-MRAM with a Coefficient >= 100fJ/Vm

    Carpenter, Robert  
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    Kim, Woojin  
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    Sankaran, Kiroubanand  
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    Ao, Nan  
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    Ben Chroud, Mohamed  
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    Kumar, A.
    Proceedings paper
    2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021
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    Design exploration of IGZO diode based VCMA array design for Storage Class Memory Applications

    Gupta, Mohit  
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    Perumkunnil, Manu  
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    Fantini, Andrea  
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    Alinezhad Chamazcoti, Saeideh  
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    Kim, Woojin  
    Proceedings paper
    2022, 52nd IEEE European Solid-State Device Research Conference (ESSDERC), SEP 19-22, 2022, p.241-244
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    Design-for-Test for Intermittent Faults in STT-MRAMs

    Yuan, Sicong  
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    Yaldagard, Mohammad Amin
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    Xun, Hanzhi
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    Fieback, Moritz
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    Marinissen, Erik Jan  
    Proceedings paper
    2024, IEEE European Test Symposium (ETS), MAY 20-24, 2024
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    Deterministic and field-free voltage-controlled MRAM for high performance and low power applications

    Wu, Jackson  
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    Kim, Woojin  
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    Garello, Kevin  
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    Yasin, Farrukh  
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    Jayakumar, Ganesh  
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    Couet, Sebastien  
    Proceedings paper
    2020, IEEE Symposium on VLSI Technology and Circuits, JUN 15-19, 2020
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    Device Aware Diagnosis for Unique Defects in STT-MRAMs

    Aouichi, Ahmed
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    Yuan, Sicong
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    Fieback, Moritz
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    Rao, Siddharth  
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    Kim, Woojin  
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    Marinissen, Erik Jan  
    Proceedings paper
    2023, 32nd IEEE Asian Test Symposium (ATS), OCT 14-17, 2023, p.71-76
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    Diffusion control in top-pinned STT-MRAM devices

    Carpenter, Robert  
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    Swerts, Johan  
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    Couet, Sebastien  
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    Mertens, Sofie  
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    Liu, Enlong
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    Kim, Woojin  
    Meeting abstract
    2019, 2019 JOINT MMM-INTERMAG Conference, 14/01/2019, p.FF-10
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    Distinctive behavior of perpendicular magnetic tunnel junctions with size comparable to the electrical switching nucleation

    Kim, Woojin  
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    Rao, Siddharth  
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    Van Beek, Simon  
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    Garello, Kevin  
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    Couet, Sebastien  
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    Swerts, Johan  
    Oral presentation
    2017, Intermag 2017
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    Double torque perpendicular STT-MRAM devices for low power IoT and edge computing

    Rao, Siddharth  
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    Carpenter, Robert  
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    Couet, Sebastien  
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    Van Beek, Simon  
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    Perumkunnil, Manu  
    Oral presentation
    2021, Intermag 2021
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    Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution

    Van Beek, Simon  
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    Rao, Siddharth  
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    Kundu, Shreya  
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    Kim, Woojin  
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    O'Sullivan, Barry J.
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    Cosemans, Stefan  
    Proceedings paper
    2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021
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    Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node

    Sakhare, Sushil
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    Perumkunnil, Manu  
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    Huynh Bao, Trong
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    Rao, Siddharth  
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    Kim, Woojin  
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    Crotti, Davide  
    Proceedings paper
    2018, IEEE International Electron Devices Meeting - IEDM, 1/12/2018, p.420-423
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    Enabling BEOL compatibility in top-pinned STT-MRAM

    Carpenter, Robert  
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    Swerts, Johan  
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    Couet, Sebastien  
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    Mertens, Sofie  
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    Hon, Kwan
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    Liu, Enlong
    Meeting abstract
    2019, York-Tohoku-Kaiserslautern Research Symposium on "New-Concept Spintronics Devices", 12/06/2019, p.37
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