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Browsing by Author "Knaepen, Werner"

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    AlON gate dielectric and gate trench cleaning for improved relia-bility of vertical GaN MOSFET

    Filho Goncalez, Walter  
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    Borga, Matteo  
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    Geens, Karen  
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    Cingu, Deepthi  
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    Chatterjee, Urmimala  
    Proceedings paper
    2022, 12th International Conference on Integrated Power Electronics Systems - CIPS, 15th to 17th of March 2022
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    Crystallization resistance of barium titanate zirconate ultrathin films from aqueousCSD: a study of cause and effect

    Hardy, An  
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    Van Elshocht, Sven  
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    Knaepen, Werner  
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    D'Haen, Jan  
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    Conard, Thierry  
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    Brijs, Bert
    Journal article
    2009, Journal of Materials Chemistry, (19) 8, p.1115-1122
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    Electrical Stability of MOS Structures With AlON and Al2O3 Dielectrics Deposited on n-and p-Type GaN

    Filho Goncalez, Walter  
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    Borga, Matteo  
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    Geens, Karen  
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    Khan, Md Arif  
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    Cingu, Deepthi  
    Journal article
    2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 9, p.5212-5217
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    Impact of sequential infiltration synthesis on pattern fidelity of DSA lines

    Singh, Arjun  
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    Knaepen, Werner  
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    Sayan, Safak
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    El Otell, Ziad  
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    Chan, BT  
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    Maes, Jan  
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    Gronheid, Roel  
    Proceedings paper
    2015, Advances in Patterning Materials and Processes XXXII, 22/02/2015, p.94250N
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    Improved cost-effectiveness of the block co-polymer anneal process for DSA

    Pathangi Sriraman, Hari
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    Stokhof, Maarten  
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    Knaepen, Werner  
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    Vaid, Varun
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    Mallik, Arindam  
    Proceedings paper
    2016, Alternative Lithographic Technologies VIII, 20/02/2016, p.97771Z
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    Integration of the Sequential Infiltration Synthesis (SIS) on Polyphtaladehyde (PPA) resist for thermal Scanning Probe Lithography (t-SPL) patterning

    Chan, BT  
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    de Marneffe, Jean-Francois  
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    Spieser, Martin
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    Knoll, Armin
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    Knaepen, Werner  
    Proceedings paper
    2017, 43rd International Conference on Micro and Nanoengineering - MNE, 18/09/2017
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    Sequential infiltration synthesis for line edge roughness mitigation of EUV resist

    Baryshnikova, Marina  
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    De Simone, Danilo  
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    Chan, BT  
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    Rincon Delgadillo, Paulina  
    Oral presentation
    2017, 34th International Conference of Photopolymer Science and Technology
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    Sequential infiltration synthesis for line edge roughness mitigation of EUV resist

    Baryshnikova, Marina  
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    De Simone, Danilo  
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    Knaepen, Werner  
    ;
    Kachel, Krzysztof
    ;
    Chan, BT  
    Journal article
    2017, Journal of Photopolymer Science and Technology, (30) 6, p.667-670

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