Browsing by Author "Kuboyama, S."
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Publication Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes
Journal article2003, Applied Physics Letters, (82) 2, p.296-298Publication Degradation and their recovery behavior of irradiated GaAlAs LEDs
Proceedings paper2008, Gettering and Defect Engineering in Semiconductor Technology XII, 14/10/2007, p.119-124Publication Degradation of SiC-MESFETs by irradiation
;Ohyama, H. ;Takakura, K. ;Uemura, K. ;Shigaki, K. ;Kudou, T. ;Matsumoto, T. ;Arai, M.Kuboyama, S.Journal article2008, Journal of Materials Science: Materials in Electronics, (19) 2, p.175-178Publication Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation
Proceedings paper2004, Proceedings 5th European Workshop on Radiation Effects on Components and Systems (RADECS), 22/09/2004, p.43-48Publication Dose rate dependence of radiation-induced lattice defects and performance degradation in npn Si bipolar transistors by 2-MeV electron irradiation
Journal article2007, Physica B: Condensed Matter, 401-402, p.469-472Publication Effect of gate interface on performance degration of irradiated SiC-MESFET
;Ohyama, H. ;Takakura, K. ;Yoneoka, M. ;Uemura, K. ;Motoki, M. ;Matsuo, K. ;Arai, M.Kuboyama, S.Journal article2007, Physica B, 401-402, p.37-40Publication Effects of electron and proton radiation on embedded SiGe source/drain diodes
;Ohyama, H. ;Nagano, T. ;Takakura, K. ;Motoki, M. ;Matsuo, M. ;Nakamura, H. ;Sawada, M.Midorikawa, M.Journal article2008, Materials Science in Semiconductor Processing, (11) 5_6, p.310-313Publication Effects of electron irradiation on SiGe devices
;Ohyama, Hidenori ;Nagano, T. ;Takakura, K. ;Motoki, M. ;Matsuo, K. ;Nakamura, H.Sawada, M.Journal article2010, Thin Solid Films, (518) 9, p.2517-2520Publication Performance degradation mechanism of irradiated GaAlAs LED
Journal article2007, Physica B, (401-402) 2007, p.33-36Publication Radiation damage of Ge diodes and MOSFETs on Ge-on-Si substrates
;Nakamura, H. ;Nagano, T. ;Sukizaki, H. ;Sakamoto, K. ;Takakura, K. ;Ohyama, H.Kuboyama, S.Oral presentation2008, 8th International Workshop on Radiation Effects on Semiconductor Devices for Space ApplicationsPublication Radiation damage of Ge-on-Si devices
;Ohyama, H. ;Sakamoto, K. ;Sukizaki, H. ;Takakura, K. ;Hayama, K. ;Motoki, M. ;Matsuo, K.Nakamura, H.Journal article2008, Materials Science in Semiconductor Processing, (11) 5_6, p.217-220Publication Radiation damage of Si photodiodes by high-temperature irradiation
Journal article2003, Microelectronic Engineering, (66) 1_4, p.536-541Publication Radiation damages of GaAlAs LEDs by 70-MeV proton and 2-MeV electron irradiation
Journal article2008, Journal of Materials Science: Materials in Electronics, (19) 2, p.171-173Publication Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs
Journal article2005, Microelectronics Reliability, (45) 9_11, p.1376-1381Publication Radiation source dependence on floating-body effect in thin gate oxide fully-depleted SOI N-MOSFETs
Proceedings paper2004, Proceedings International Workshop on Radiation Effects in Semiconductor Devices for Space Applications, p.249-252Publication Radiaton damage of SiC Schotttky diodes by electron irradiation
;Ohyama, H. ;Takakura, K. ;Watanabe, T. ;Nishiyama, K. ;Shigaki, K. ;Kudou, T.Nakabayashi, M.Journal article2005, Journal of Materials Science: Materials in Electronics, (6) 7, p.455-458