Browsing by Author "Kunert, Bernardette"
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Publication 0.3pA Dark Current and 0.65A/W Responsivity 1020nm InGaAs/GaAs Nano-Ridge Waveguide Photodetector Monolithically Integrated on a 300-mm Si Wafer
Proceedings paper2020, European Conference on Optical Communications (ECOC), DEC 06-10, 2020Publication A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and RF technologies
Proceedings paper2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021Publication A ViT-Based Approach for Enhanced Defect Classification in Nano-Ridge Engineering Using Multi-Resolution Images
Proceedings paper2025, 2025 Conference on Metrology Inspection and Process Control-Annual, 2025-02-28, p.134263H-1-134263H-21Publication Advanced characterization and parameter extraction of electrically injected InGaAs/GaAs nano-ridge lasers monolithically integrated on silicon
Journal article2025-JUN 30, OPTICS EXPRESS, (33) 13, p.27929-27941Publication Advanced Current-Voltage Model of Electrical Contacts to GaAs- and Ge-Based Active Silicon Photonic Devices
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 8, p.4274-4279Publication Advanced transistors for high frequency applications
Proceedings paper2020, 237th ECS Spring Meeting - Advanced CMOS-compatible Semiconductor Devices 19, 10/05/2020, p.27-38Publication An adaptable In(Ga)P/Ga(Sb)As/Ga(In)As HBT technology on 300 mm Si for RF applications
Proceedings paper2024, IEEE/MTT-S International Microwave Symposium (IMS), JUN 16-21, 2024, p.940-943Publication Anisotropic relaxation behavior of InGaAs/GaAs selectively grown in narrow trenches on (001) Si substrates
Journal article2017, Journal of Applied Physics, (122) 2, p.25303Publication Application of an Sb Surfactant in InGaAs Nano-ridge Engineering on 300 mm Silicon Substrates
Journal article2021, CRYSTAL GROWTH & DESIGN, (21) 3, p.1657-1665Publication Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations
Journal article2020, Ultramicroscopy, 210, p.112928Publication Are extended defects a show stopper for future III-V CMOS technologies?
;Claeys, Cor; ;He, Liang; ; ; Proceedings paper2018-06, 19th International Conference on Extended Defects in Semiconductors - EDS, 24/06/2018Publication Challenges on surface conditioning in 3D device architectures: triple-gate FinFETs, gate-all-around lateral and vertical nanowire FETs
Proceedings paper2017, 232nd ECS Fall Meeting - 15th International Symposium on Semiconductor Cleaning Science and Technology - SCST15, 1/10/2017, p.3-20Publication Challenges on surface conditioning in 3D device architectures: triple-gate finFETs, gate-all-around lateral and vertical nanowireFETs
Meeting abstract2017, 15th International Symposium on Semiconductor Cleaning Science and Technology at the 232nd ECS Fall Meeting, 1/10/2017, p.1055Publication Compact 1.31-μm-emission In0.45Ga0.55As/ In0.25Ga0.75As photonic crystal nanoridge laser monolithically grown on 300 mm silicon substrate
Proceedings paper2024, Conference on Integrated Photonics Platforms III, APR 07-10, 2024Publication Constructing III-V nano-ridge photodetectors on silicon: Monolithic integration of III-V devices delivers high-quality detection in the infrared
Journal article2021, Compound Semiconductor, (27) V, p.46-50Publication DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates
Proceedings paper2021, 15th European Microwave Integrated Circuits Conference (EuMIC) / 50th European Microwave Conference (EuMC), JAN 10-15, 2021, p.89-92Publication Deep traps in In0.3Ga0.7As nFinFETs, studied by generation-recombination noise
Proceedings paper2017, International Conference on Noise and 1/f Fluctuations - ICNF, 20/06/2017, p.1-4Publication Deep-level transient spectroscopy of GaAs nanoridge diodes grown on Si substrates
Journal article2020, Physical Review Applied, (14) 2, p.24093Publication Degradation Mechanisms of Monolithic GaAs-on-Si Nano-Ridge Quantum Well Lasers
Journal article2025-JUN 15, JOURNAL OF LIGHTWAVE TECHNOLOGY, (43) 12, p.5811-5819Publication Direct three-dimensional observation of the conduction in poly-Si and In1-xGaxAs 3D NAND vertical channels
Proceedings paper2016, IEEE Symposium on VLSI Technology, 14/06/2016, p.192-193