Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Lafferty, Neal"

Filter results by typing the first few letters
Now showing 1 - 9 of 9
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Complementary dipole exposure solutions at 0.29k1

    Hendrickx, Eric  
    ;
    Torres, Andres
    ;
    Lafferty, Neal
    ;
    Le Cam, Laurent
    ;
    Johnson, Stephen
    ;
    Reita, Carlo
    Proceedings paper
    2005, Optical Microlithography XVIII, 27/02/2005, p.327-338
  • Loading...
    Thumbnail Image
    Publication

    Directed self-assembly (DSA) grapho-epitaxy template generation with immersion lithography

    Ma, Yuansheng
    ;
    Lei, Junjiang
    ;
    Torres, J. Andres
    ;
    Hong, Le
    ;
    Word, James
    ;
    Fenger, Germain
    Proceedings paper
    2015, Alternative Lithographic Technologies VII, 22/02/2015, p.942306
  • Loading...
    Thumbnail Image
    Publication

    Directed self-assembly graphoepitaxy template generation with immersion lithography

    Ma, Yuansheng
    ;
    Lei, Junjiang
    ;
    Torres, J. Andres
    ;
    Hong, Le
    ;
    Word, James
    ;
    Fenger, Germain
    Journal article
    2015, Journal of Micro/Nanolithography MEMS and MOEMS, (14) 3, p.31216
  • Loading...
    Thumbnail Image
    Publication

    EUV based multi-patterning schemes for advanced DRAM nodes

    Das, Sayantan  
    ;
    Sah, Kaushik
    ;
    Fallica, Roberto  
    ;
    Chen, Zhijin
    ;
    Halder, Sandip  
    ;
    Cross, Andrew
    Proceedings paper
    2022, Conference on Advances in Patterning Materials and Processes XXXIX Part of SPIE Advanced Lithography and Patterning Conference, APR 24-MAY 27, 2022, p.Art. 1205503
  • Loading...
    Thumbnail Image
    Publication

    Exploring alternative EUV mask absorber for iN5 self-aligned block and contact layers

    Sejpal, Rajiv
    ;
    Philipsen, Vicky  
    ;
    Armeanu, Ana
    ;
    Wei, Chi-I
    ;
    Gillijns, Werner  
    ;
    Lafferty, Neal
    Proceedings paper
    2019, Photomask Technology 2019, 16/09/2019, p.111481B
  • Loading...
    Thumbnail Image
    Publication

    Gray assist bar OPC

    Lafferty, Neal
    ;
    Vandenberghe, Geert  
    ;
    Smith, B.W.
    ;
    Lassiter, Matthew
    ;
    Martin, Patrick M.
    Proceedings paper
    2004-10, Optical Microlithography XVII, 22/02/2004, p.381-392
  • Loading...
    Thumbnail Image
    Publication

    High NA EUV single patterning of advanced metal logic nodes: Inverse lithography techniques in combination with alternative mask absorbers

    Armeanu, Ana-Maria
    ;
    Pellens, Nick  
    ;
    Philipsen, Vicky  
    ;
    Malankin, Evgeny
    ;
    Xu, Dongbo
    Proceedings paper
    2024, 39th European Mask and Lithography Conference (EMLC), JUN 17-19, 2024, p.Art. 132731M
  • Loading...
    Thumbnail Image
    Publication

    Physically-based compact models for fast lithography simulation

    Lafferty, Neal
    ;
    Adam, Kostas
    ;
    Granik, Yuri
    ;
    Torres, Andres
    ;
    Maurer, Wilhelm
    Proceedings paper
    2005, Optical Microlithography XVIII, 1/03/2005, p.537-542
  • Loading...
    Thumbnail Image
    Publication

    Single Mask Solution to Pattern BLP and SNLP using 0.33NA EUV for Next Generation DRAM Manufacturing

    Sah, Kaushik
    ;
    Cross, Andrew
    ;
    Das, Sayantan  
    ;
    Fallica, Roberto  
    ;
    Lee, Jeonghoon  
    ;
    Kim, Ryan Ryoung han
    Proceedings paper
    2022, International Conference on Extreme Ultraviolet Lithography, SEP 26-29, 2022, p.Art. 122920W

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings