Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Lambert, U."

Filter results by typing the first few letters
Now showing 1 - 10 of 10
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Correlation between grown-in silicon substrate defects and silicon gate oxide breakdown characteristics

    Vanhellemont, Jan
    ;
    Kissinger, G.
    ;
    Kenis, Karine  
    ;
    Depas, Michel
    ;
    Gräf, D.
    ;
    Lambert, U.
    ;
    Wagner, P.
    Meeting abstract
    1996, Belgische Natuurkundige Vereniging. Algemene Wetenschappelijke Vergadering, 6/06/1996
  • Loading...
    Thumbnail Image
    Publication

    Defects in As-grown silicon and their evolution during heat treatments

    Vanhellemont, Jan
    ;
    Dornberger, E.
    ;
    Esfandyari, J.
    ;
    Kissinger, G.
    ;
    Trauwaert, Marie-Astrid
    Proceedings paper
    1997, Defects in Semiconductors 19 - ICDS 19, 21/07/1997, p.341-6
  • Loading...
    Thumbnail Image
    Publication

    Differential interference contrast microscopy of defects in As-grown and annealed Si wafers

    Trauwaert, Marie-Astrid
    ;
    Vanhellemont, Jan
    ;
    Lambert, U.
    ;
    Gräf, D.
    ;
    Kenis, Karine  
    ;
    Mertens, Paul  
    Proceedings paper
    1997, Proceedings of the 7th International Autumn Meeting : Gettering and Defect Engineering in Semiconductor Technology - GADEST '97, 5/10/1997, p.387-392
  • Loading...
    Thumbnail Image
    Publication

    Grown-in defect density spectra in czochralski silicon wafers

    Kissinger, G.
    ;
    Gräf, D.
    ;
    Lambert, U.
    ;
    Vanhellemont, Jan
    ;
    Richter, H.
    Oral presentation
    1996, 2nd International Symposium on Advanced Science and Technology of Silicon Materials
  • Loading...
    Thumbnail Image
    Publication

    Lattice defects in high quality as-grown CZ silicon, studied with light scattering and preferential etching techniques

    Vanhellemont, Jan
    ;
    Kissinger, G.
    ;
    Gräf, D.
    ;
    Kenis, Karine  
    ;
    Depas, Michel
    ;
    Mertens, Paul  
    ;
    Lambert, U.
    Proceedings paper
    1995, Proceedings 18th International Conference on Defects in Semiconductors - ICDS-18; July 23 -28, 1995; Sendai, Japan., 23/07/1995, p.1755-1760
  • Loading...
    Thumbnail Image
    Publication

    Light scattering tomography study of lattice defects in high quality as-grown Cz silicon wafers and their evolution during gate oxidation

    Vanhellemont, Jan
    ;
    Kissinger, G.
    ;
    Gräf, D.
    ;
    Kenis, Karine  
    ;
    Depas, Michel
    ;
    Mertens, Paul  
    ;
    Lambert, U.
    Proceedings paper
    1996, Defect Recognition and Image Processing in Semiconductors - DRIP. Proceedings of the 6th International Conference, 3/12/1995, p.331-336
  • Loading...
    Thumbnail Image
    Publication

    Measurement, modelling and simulation of defects in as-grown Czrochalski silicon

    Vanhellemont, Jan
    ;
    Senkader, S.
    ;
    Kissinger, G.
    ;
    Higgs, V.
    ;
    Trauwaert, Marie-Astrid
    ;
    Graef, D.
    Journal article
    1997, Journal of Crystal Growth, (180) 3_4, p.353-62
  • Loading...
    Thumbnail Image
    Publication

    On the impact of grown-in silicon oxide precipitate nuclei on silicon gate oxide integrity

    Vanhellemont, Jan
    ;
    Kissinger, G.
    ;
    Kenis, Karine  
    ;
    Depas, Michel
    ;
    Gräf, D.
    ;
    Lambert, U.
    Proceedings paper
    1996, Early Stages of Oxygen Precipitation in Silicon; NATO Advanced Research Workshop on Early Stages of Oxygen Precipitation in Sili, 26/03/1996, p.493-500
  • Loading...
    Thumbnail Image
    Publication

    On the impact of grown-in substrate defects and iron contamination on gate oxide integrity

    Vanhellemont, Jan
    ;
    Kissinger, G.
    ;
    Kenis, Karine  
    ;
    Depas, Michel
    ;
    Gräf, D.
    ;
    Lambert, U.
    Proceedings paper
    1996, Proceedings of the 3rd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS, 23/09/1996, p.313-316
  • Loading...
    Thumbnail Image
    Publication

    On the nature of grown-in defects in silicon: dependence on pulling conditions and evolution during treatments

    Vanhellemont, Jan
    ;
    Kissinger, G.
    ;
    Senkader, S.
    ;
    Gräf, D.
    ;
    Kenis, Karine  
    ;
    Depas, Michel
    ;
    Lambert, U.
    Proceedings paper
    1996, Proceedings of the 4th International Symposium on High Purity Silicon, 6/10/1996, p.226-237

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings