Browsing by Author "Lanza, Mario"

A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs

Advanced Data Encryption using 2D Materials

Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors

Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups

Standards for the Characterization of Endurance in Resistive Switching Devices

Temperature of Conductive Nanofilaments in Hexagonal Boron Nitride Based Memristors Showing Threshold Resistive Switching

Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices