Browsing by Author "Nishi, Y."
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Publication Bandgap narrowing in low-k dielectrics
; ; Nishi, Y.Meeting abstract2015, AVS 62nd International Symposium & Exhibition, 18/10/2015Publication Defect-induced bandgap narrowing in low-k dielectrics
; ; Nishi, Y.Journal article2015, Applied Physics Letters, (107) 8, p.82903Publication GeSn channel nMOSFETs: material potential and technological outlook
Proceedings paper2012, Symposium on VLSI Technology, 12/06/2012, p.95-96Publication H-treatment impact on conductive-filament formation and stability in Ta2O5-based resistive-switching memory cells
Journal article2015, Journal of Applied Physics, (117) 12, p.124501Publication Influence of porosity on electrical properties of low-k dielectrics irradiated with vacuum ultraviolet radiation
Meeting abstract2014, AVS 61st InternationalSymposium and Exhibition, 9/11/2014, p.PS-TuP12Publication Influence of porosity on electrical properties of low-k dielectrics irradiated with vacuum-ultraviolet radiation
Journal article2016, Applied Physics Letters, (109) 12, p.122902Publication Influence of porosity on VUV induced damage to low-k dielectrics
Meeting abstract2015, AVD 62nd International Symposium & Exhibition, 18/10/2015Publication The effects of vacuum-ultraviolet radiation on defects in low-k organosilicate glass
; Publication Towards high mobility GeSn channel nMOSFETs: improved surface passivation using novel ozone oxidation method
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