Browsing by Author "Op de Beeck, Jonathan"

3D imaging of atom probe tip shapes with atomic force microscopy

APT tip shape imaging by SPM

Combined in-situ scanning force microscopy/TOFSIMS and FIB-TOFSIMS analysis: towards 3D chemical analysis

Direct imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors

Direct probing of the dielectric scavenging-layer interface in oxide filamentary-based valence change memory

Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy

Improving APT-AFM technology: towards high resolution 3D APT tip shapes

Nanoscale electrochemical response of lithium-ion cathodes: a combinatorial study using C-AFM and SIMS

Nanoscale localisation of an atom probe tip through electric field mapping

Opportunities and challenges in APT metrology for semiconductor applications

Scanning probe microscopy for atom probe tip shape monitoring

The need of a reference for APT-AFM tip reconstruction

The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes

The synergy of AFM and SIMS for advanced characterization of Li-ion battery cathodes

Tip-to-tip approach for APT shape imaging