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Browsing by Author "Papameletis, Christos"

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    3D design-for-test architecture

    Marinissen, Erik Jan  
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    Konijnenburg, Mario  
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    Verbree, Jouke
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    Chi, Chun-Chuan
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    Deutsch, Sergej
    Book chapter
    2019-03
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    A 3D-DfT demonstrator

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Proceedings paper
    2014-05, IEEE North-Atlantic Test Workshop, 14/05/2014
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    A 3D-DfT demonstrator

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Proceedings paper
    2014-06, Design Automation Conference - DAC, 1/06/2014
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    A DfT architecture and tool flow for 3D-SICs with test data compression, embedded cores, and multiple towers

    Papameletis, Christos
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    Keller, Brion
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    Chickermane, Vivek
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    Hamdioui, Said
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    Marinissen, Erik Jan  
    Journal article
    2015, IEEE Design & Test, (32) 4, p.40-48
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    At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs

    Shibin, Konstantin
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    Chickermane, Vivek
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    Keller, Brion
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    Papameletis, Christos
    Proceedings paper
    2015-05, IEEE European Test Symposium - ETS, 25/05/2015
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    At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs

    Shibin, Konstantin
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    Chickermane, Vivek
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    Keller, Brion
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    Papameletis, Christos
    Meeting abstract
    2015-05, CDN Live EMEA, 27/04/2015
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    At-Speed delay testing of inter-die connections of 2.5D- and 3D-SICs

    Shibin, Konstantin
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    Chickermane, Vivek
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    Keller, Brion
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    Papameletis, Christos
    Proceedings paper
    2015-05, IEEE North-Atlantic Test Workshop - NATW, 11/05/2015
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    At-speed inter-die interconnect test in 2.5D- and 3D-SICs

    Shibin, Konstantin
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    Chickermane, Vivek
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    Keller, Brion
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    Papameletis, Christos
    Proceedings paper
    2015-10, IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST), 8/10/2015
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    At-speed testing of inter-die connections of 3D-SICs in the presence of shore logic

    Shibin, Konstantin
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    Chickermane, Vivek
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    Keller, Brion
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    Papameletis, Christos
    Proceedings paper
    2015-11, IEEE Asian Test Symposium - ATS, 22/11/2015
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    Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers

    Papameletis, Christos
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    Keller, Brion
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    Chickermane, Vivek
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    Marinissen, Erik Jan  
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    Hamdioui, Said
    Proceedings paper
    2013-05, IEEE European Test Symposium - ETS, 27/05/2013, p.15-20
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    Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers

    Papameletis, Christos
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    Keller, Brion
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    Chickermane, Vivek
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    Marinissen, Erik Jan  
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    Hamdioui, Said
    Oral presentation
    2013, Cadence CDNLive! EMEA
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    Design, test generation, processing, and pre- and post-bond measurement results of a 3D-DfT demonstrator chip stack

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Proceedings paper
    2014-05, CDN Live! EMEA, 19/05/2014
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    Design, test generation, processing, and pre- and post-bond measurement results of a 3D-DfT demonstrator chip stack

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Oral presentation
    2014, Design, Automation, and Test in Europe - DATE': Friday Workshop on 3D Integration
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    Embedded toggle generator to control the switching activity

    Katselas, Leonidas  
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    Athanasiadis, Angelos
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    Hatzopoulos, Alkis
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    Jiao, Hailong
    Proceedings paper
    2017-09, IEEE International Symposium on Power and Timing Modeling, Optimization, and Simulation - PATMOS, 25/09/2017, p.1-8
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    Embedded toggle generator to provide realistic test conditions during test of digital 2D-SoCs and 3D-SICs

    Katselas, Leonidas  
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    Hatzopoulos, Alkis
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    Jiao, Hailong
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    Papameletis, Christos
    Proceedings paper
    2018-05, CDN Live EMEA 2018, 7/05/2018
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    Extension of a 3D-DfT architecture for embedded cores and multiple towers

    Papameletis, Christos
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    Chickermane, Vivek
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    Keller, Brion
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    Marinissen, Erik Jan  
    Proceedings paper
    2012, IEEE International Workshop on Testing Three-Dimensional Stacked ICs - 3D-TEST, 8/11/2012
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    Imec's 3D-DfT architecture: basics, extensions, and demonstrator results

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Proceedings paper
    2014-06, Workshop on Design for 3D Silicon Integration - D43D, 23/06/2014
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    On-chip toggle generators to provide realistic conditions during test of digital 2D-SoCs and 3D-SICs

    Katselas, Leonidas  
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    Hatzopoulos, Alkis
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    Jiao, Hailong
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    Papameletis, Christos
    Proceedings paper
    2018-11, IEEE International Test Conference - ITC'18, 28/10/2018, p.1-9
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    Vesuvius-3D: A 3D-DfT demonstrator

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
    ;
    Deutsch, Sergej
    Proceedings paper
    2014-10, IEEE International Test Conference - ITC, 21/10/2014, p.1-10

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