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Browsing by Author "Pinardi, Kuntjoro"

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    A method to interpret micro-Raman experiments made to measure nonuniform stresses: application to local oxidation of silicon structures

    Pinardi, Kuntjoro
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    Jain, Suresh
    ;
    Willander, M.
    ;
    Atkinson, A.
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    Maes, Herman
    Journal article
    1998, Journal of Applied Physics, (84) 5, p.2507-2512
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    A review of recent work on stresses and strains in semiconductor heterostructures

    Jain, Suresh
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    Willander, M.
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    Pinardi, Kuntjoro
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    Maes, Herman
    Journal article
    1997, Physica Scripta, T69, p.65-72
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    Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers

    Pinardi, Kuntjoro
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    Jain, Uma
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    Jain, Suresh
    ;
    Maes, Herman
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    Van Overstraeten, Roger
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    Willander, M.
    Journal article
    1998, Journal of Applied Physics, (83) 9, p.4724-4733
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    Depth profiling of strain using micro-Raman measurements

    Atkinson, A.
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    Jain, Suresh
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    Maes, Herman
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    Pinardi, Kuntjoro
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    Willander, M.
    Journal article
    2001, Semiconductor Science and Technology, (16) 7, p.584-588
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    Dislocations in GaN/sapphire films: their distribution and effect on stress and optical properties

    Jain, Suresh
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    Pinardi, Kuntjoro
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    Maes, Herman
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    Van Overstraeten, Roger
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    Willander, M.
    Proceedings paper
    1998, Nitride Semiconductors, 1/12/1997, p.875-880
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    Effect of elastic constants on the stresses in stripes and substrates: a 2D FE calculation

    Jain, Suresh
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    Pinardi, Kuntjoro
    ;
    Maes, Herman
    ;
    Van Overstraeten, Roger
    ;
    Willander, M.
    Journal article
    1998, Semiconductor Science and Technology, (13) 8, p.864-870
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    Experimental validation of mechanical stress models by micro-Raman spectroscopy

    De Wolf, Ingrid  
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    Pozzat, G.
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    Pinardi, Kuntjoro
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    Howard, Dave
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    Ignat, M.
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    Jain, Suresh
    ;
    Maes, Herman
    Journal article
    1996, Microelectronics and Reliability, 36, p.1751-1754
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    Experimental validation of mechanical stress models by micro-Raman spectroscopy

    De Wolf, Ingrid  
    ;
    Pozzat, G.
    ;
    Pinardi, Kuntjoro
    ;
    Howard, Dave
    ;
    Ignat, M.
    ;
    Jain, Suresh
    ;
    Maes, Herman
    Proceedings paper
    1996, Proceedings ESREF '96 - 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 8/10/1996, p.1751-1754
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    Finite element calculations to optimize the design of a stressor for strained induced quantum wires and quantum dots in GaAs

    Pinardi, Kuntjoro
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    Jain, Suresh
    ;
    Maes, Herman
    Proceedings paper
    1996, Compound Semiconductor Electronics and Photonics, 8/04/1996, p.119-124
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    Measurement of nonuniform stresses in semiconductor films by optical methods

    Pinardi, Kuntjoro
    ;
    Jain, Suresh
    ;
    Maes, Herman
    ;
    Van Overstraeten, Roger
    ;
    Willander, M.
    Oral presentation
    1997, Materials Research Society 1997 Fall Meeting : Symposium on Thin Film Stresses and Mechanical Properties; December 1-5, 1997; Bo
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    Measurement of nonuniform stresses in semiconductors by the micro-Raman method

    Pinardi, Kuntjoro
    ;
    Jain, Suresh
    ;
    Maes, Herman
    ;
    Van Overstraeten, Roger
    ;
    Willander, M.
    Proceedings paper
    1998, Thin Films: Stresses and Mechanical Propeties VII, 1/12/1997, p.507-512
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    Measurement of residual stress in thin films by using the optical microprobe

    Atkinson, A.
    ;
    Clarke, D. R.
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    Jain, Suresh
    ;
    Pinardi, Kuntjoro
    ;
    Webb, S.
    Proceedings paper
    1998, Thin Films: Stresses and Mechanical Propeties VII, 1/12/1997, p.513-518
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    Mechanical and optical properties of selectively grown AlGaN stripes

    Jain, Suresh
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    Pinardi, Kuntjoro
    ;
    Maes, Herman
    ;
    Willander, M.
    Oral presentation
    1997, Materials Research Society 1997 Fall Meeting : Symposium on Nitride Semiconductors; December 1-5, 1997; Boston, Mass., USA.
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    Raman spectra of Ge0.11Si0.89 strained quantum wires

    Jain, Suresh
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    Pinardi, Kuntjoro
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    Maes, Herman
    ;
    Van Overstraeten, Roger
    ;
    Atkinson, A.
    Journal article
    1997, Semiconductor Science and Technology, (12) 11, p.1507-1509
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    Stability of dislocations in epitaxially strained semiconductor strained stripe stripe films

    Atkinson, A.
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    Pinardi, Kuntjoro
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    Jain, Suresh
    Journal article
    1996, Semiconductor Science and Technology, (11) 9, p.1271-1275
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    Stability of epitaxially strained semiconductor stripes

    Atkinson, A.
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    Jain, Suresh
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    Pinardi, Kuntjoro
    Oral presentation
    1996, Materials Research Society Spring Meeting. Symposium B on Defects and Interfaces in Lattice-Mismatched Semiconductor Heterostruc
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    Stresses and strains in lattice-mismatched stripes, quantum wires, quantum dots, and substrates in Si technology

    Jain, Suresh
    ;
    Maes, Herman
    ;
    Pinardi, Kuntjoro
    ;
    De Wolf, Ingrid  
    Journal article
    1996, Journal of Applied Physics, 79, p.8145-8165
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    Stresses in selectively grown III-V semiconductor stripes and buried quantum wire lasers: effect on optical properties

    Jain, Suresh
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    Pinardi, Kuntjoro
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    Harker, A. H.
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    Willander, M.
    ;
    Maes, Herman
    ;
    Mertens, Robert  
    Proceedings paper
    1995, 25th European Solid State Device Research Conference - ESSDERC, 25/09/1995, p.459-462
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    Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-Raman and other measurements

    Jain, Suresh
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    Maes, Herman
    ;
    Pinardi, Kuntjoro
    Journal article
    1997, Thin Solid Films, (292) 1_2, p.218-226
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    Structure of II-VI lattice mismached epilayers used for blue-green lasers for underwater communication

    Pinardi, Kuntjoro
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    Maes, Herman
    ;
    Jain, Suresh
    Journal article
    1998, Defense Science Journal, 48, p.31-43
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