Browsing by Author "Raghavan, Naga"
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Publication Improvement of data retention in HfO2 / Hf 1T1R RRAM cell under low operating current
Proceedings paper2013, International Electron Deives Meeting - IEDM, 9/12/2013, p.352-355Publication Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability
Proceedings paper2013, International Reliability Physics Symposium - IRPS, 14/04/2013, p.5E.3Publication Modeling RRAM SET and RESET statistics with guidelines for optimized operation
Proceedings paper2013, Symposium on VLSI Technology, 11/06/2013, p.8-JanPublication Modeling the impact of reset depth on vacancy-induced filament perturbations in HfO2 RRAM
Journal article2013, IEEE Electron Device Letters, (34) 5, p.614-616Publication On the bipolar resistive-switching characteristics of Al2O3- and HfO2-based memory cells operated in the soft-breakdown regime
Journal article2014, Journal of Applied Physics, (116) 13, p.134502Publication Performance and reliability of ultra-thin HfO2-based RRAM (UTO-RRAM)
Proceedings paper2013, 5th International Memory Workshop - IMW, 26/05/2013, p.48-51Publication RTN insight to filamentary instability and disturb immunity in ultra-low power switching HfOx and AlOx-based RRAM
Proceedings paper2013, Symposium on VLSI Technology, 11/06/2013, p.T164-T165Publication Statistical insight into controlled forming and forming free stacks for HfOx RRAM
Journal article2013, Microelectronic Engineering, 109, p.177-181Publication Stochastic variability of vacancy filament configuration in ultra-thin dielectric RRAM and its impact on OFF-state reliability
Proceedings paper2013, International Electron Devices Meeting - IEDM, 9/12/2013, p.554-557Publication Switching aspects of RRAM – first principles and model simulations insight
Proceedings paper2013, AVS 60th International Symposium and Exhibition, 27/10/2013, p.62Publication Understanding the intrinsic characteristics and memory trade-offs of sub-μA filamentary RRAM operation
Proceedings paper2013, VLSI Technology Symposium, 11/06/2013, p.162-163