Browsing by Author "Reed, R.A."
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Publication Efficient reliability testing of emerging memory technologies using multiple radiation sources
Publication Heavy ion and laser induced charge collection in SiGe bulk PMOSFETs
Publication Heavy ion and laser-induced transients in SiGe channel pMOSFETs
Publication Heavy-ion-induced current transients in bulk and SOI FinFETs
Publication Impact of back-gate bias and fevice geometry on the total ionizing dose response of 1-transistor floating body RAMs
Journal article2012, IEEE Transactions on Nuclear Science, (59) 6, p.2966-2973Publication Laser- and heavy ion-induced charge collection in bulk FinFETs
Publication Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFET devices
Proceedings paper2011, IEEE International Reliability Physics Symposium - IRPS, 10/04/2011, p.882-885Publication Radiation hardness aspects of advanced FinFET and UTBOX devices
Proceedings paper2012, IEEE International SOI Conference, 1/10/2012, p.3.7Publication TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories
Publication Total ionizing dose effects on Ge channel pFETs with raised Si0.55Ge0.45 source drain
Publication Total-ionizing-dose effects and low-frequency noise in 30-nm gate-length Bulk and SOI FinFETs with SiO2/HfO2 gate delectrics
Publication Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs
Oral presentation2012, IEEE Nuclear and Space Radiation Effects Conference - NSREC