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Browsing by Author "Rodríguez, Rosana"

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    A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics

    Amat, Esteve
    ;
    Kauerauf, Thomas
    ;
    Rodríguez, Rosana
    ;
    Nafría, Montse
    ;
    Aymerich, Xavier
    Journal article
    2013, Microelectronic Engineering, 103, p.144-149
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    Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

    Amat, Esteve
    ;
    Kauerauf, Thomas
    ;
    Degraeve, Robin  
    ;
    Rodríguez, Rosana
    ;
    Nafría, Montse
    Journal article
    2010, Microelectronic Engineering, (87) 1, p.47-50
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    Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks

    Amat, Esteve
    ;
    Kauerauf, Thomas
    ;
    Degraeve, Robin  
    ;
    De Keersgieter, An  
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    Rodríguez, Rosana
    Journal article
    2009, IEEE Transactions on Device and Materials Reliability, (9) 3, p.425-430
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    Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures

    Amat, Esteve
    ;
    Kauerauf, Thomas
    ;
    Degraeve, Robin  
    ;
    Rodríguez, Rosana
    ;
    Nafría, Montse
    Journal article
    2009, IEEE Transactions on Device and Materials Reliability, (9) 3, p.454-458
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    Gate voltage influence on the channel hot-carrier degradation of high-k-based devices

    Amat, Esteve
    ;
    Kauerauf, Thomas
    ;
    Degraeve, Robin  
    ;
    Rodríguez, Rosana
    ;
    Nafria, Montse
    Journal article
    2011, IEEE Transactions on Device and Materials Reliability, (11) 1, p.92-96
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    New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices

    Amat, Esteve
    ;
    Rodríguez, Rosana
    ;
    Nafria, Montse
    ;
    Aymerich, Xavier
    ;
    Kauerauf, Thomas
    Proceedings paper
    2009, 47th Annual IEEE International Reliability Physics Symposium - IRPS, 26/04/2009, p.1028-1032
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    Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric

    Amat, Esteve
    ;
    Kauerauf, Thomas
    ;
    Degraeve, Robin  
    ;
    Rodríguez, Rosana
    ;
    Nafría, Montse
    Journal article
    2010, International Journal of Numerical Modelling, (23) 4_5, p.315-323

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