Browsing by Author "Rodríguez, Rosana"
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Publication A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics
;Amat, Esteve ;Kauerauf, Thomas ;Rodríguez, Rosana ;Nafría, MontseAymerich, XavierJournal article2013, Microelectronic Engineering, 103, p.144-149Publication Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack
Journal article2010, Microelectronic Engineering, (87) 1, p.47-50Publication Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks
Journal article2009, IEEE Transactions on Device and Materials Reliability, (9) 3, p.425-430Publication Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures
Journal article2009, IEEE Transactions on Device and Materials Reliability, (9) 3, p.454-458Publication Gate voltage influence on the channel hot-carrier degradation of high-k-based devices
Journal article2011, IEEE Transactions on Device and Materials Reliability, (11) 1, p.92-96Publication New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices
;Amat, Esteve ;Rodríguez, Rosana ;Nafria, Montse ;Aymerich, XavierKauerauf, ThomasProceedings paper2009, 47th Annual IEEE International Reliability Physics Symposium - IRPS, 26/04/2009, p.1028-1032Publication Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric
Journal article2010, International Journal of Numerical Modelling, (23) 4_5, p.315-323