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Browsing by Author "Rooyackers, Rita"

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    25% drive current improvement for p-type Multiple Gate FET (MuGFET) devices by the introduction of recessed Si0.8Ge0.2 in the source and drain regions

    Verheyen, Peter  
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    Collaert, Nadine  
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    Rooyackers, Rita
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    Loo, Roger  
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    Shamiryan, Denis
    Proceedings paper
    2005, Symposium on VLSI Technology. Digest of Technical Papers, 14/06/2005, p.194-195
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    90nm RF CMOS technology for low-power 900MHz applications

    Ramos, Javier
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    Mercha, Abdelkarim  
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    Jeamsaksiri, Wutthinan
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    Linten, Dimitri  
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    Jenei, Snezana
    Proceedings paper
    2004, Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC, 21/09/2004, p.329-332
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    A 0.314mm2 6T-SRAM cell built with tall triple-gate devices for 45nm node applications using 0.75NA 193nm lithography

    Nackaerts, Axel
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    Ercken, Monique  
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    Demuynck, Steven  
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    Lauwers, Anne  
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    Baerts, Christina  
    Proceedings paper
    2004-12, Technical Digest International Electron Devices Meeting - IEDM, 13/12/2004, p.269-272
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    A 10-bit current-steering FinFET D/A converter

    Fulde, Michael
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    Kuttner, F.
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    von Armin, Klaus
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    Parvais, Bertrand  
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    Mercha, Abdelkarim  
    Proceedings paper
    2008, IEEE International SOI Conference Proceedings, 6/10/2008, p.95-96
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    A 35nm diameter vertical silicon nanowire short-gate tunnelFET

    Vandooren, Anne  
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    Rooyackers, Rita
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    Leonelli, Daniele  
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    Iacopi, Francesca
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    De Gendt, Stefan  
    Proceedings paper
    2009, Nanotechnology Workshop, 13/06/2009
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    A functional 41-stage ring oscillator using scaled FinFET devices with 25nm gate lengths and 10nm Fin widths applicable for the 45nm CMOS node

    Collaert, Nadine  
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    Dixit, Abhisek
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    Goodwin, Michael
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    Kottantharayil, Anil
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    Rooyackers, Rita
    Journal article
    2004-08, IEEE Electron Device Letters, (25) 8, p.568-570
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    A high performance 0.18µm elevated source/drain technology with improved manufacturability

    Augendre, Emmanuel
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    Rooyackers, Rita
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    Vandamme, Ewout
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    Perello, Carles
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    Van Dievel, Marc  
    Proceedings paper
    1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference, 13/09/1999, p.636-639
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    A low-power multi-gate FET CMOS technology with 13.9ps inverter delay, large-scale integrated high performance digital circuits and SRAM

    von Arnim, Klaus
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    Augendre, Emmanuel
    ;
    Pacha, C.
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    Schulz, Thomas
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    San, Kemal Tamer
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    Bauer, F.
    Proceedings paper
    2007, Symposium on VLSI Technology. Digest of Technical Papers, 14/06/2007, p.106-107
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    A new complementary hetero-junction vertical tunnel-FET integration scheme

    Rooyackers, Rita
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    Vandooren, Anne  
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    Verhulst, Anne  
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    Walke, A.
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    Devriendt, Katia  
    Proceedings paper
    2013, International Electron Devices Meeting - IEDM, 9/12/2013, p.92-95
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    A new direction for III-V FETs for mobile CPU operation uncluding burst-mode: In0.35Ga0.65As channel

    Rakshit, T.
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    Obradovic, B.
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    Wang, W.-E.
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    Kim, Weon Hong
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    Shin, Keo Myoung
    ;
    Baek, Seongcheol
    Journal article
    2017, IEEE Transactions on Electron Devices, (38) 3, p.314-317
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    A new dummy-free shallow trench isolation concept for mixed-signal applications

    Badenes, Gonçal
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    Rooyackers, Rita
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    Augendre, Emmanuel
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    Vandamme, Ewout
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    Perello, Carles
    Proceedings paper
    1999, ULSI Process Integration. Proceedings of the First International Symposium, 17/10/1999, p.231-241
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    A new dummy-free shallow trench isolation concept for mixed-signal applications

    Badenes, Gonçal
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    Rooyackers, Rita
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    Augendre, Emmanuel
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    Vandamme, Ewout
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    Perello, Carles
    Journal article
    2000, Journal of the Electrochemical Society, (147) 10, p.3287-3282
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    A novel approach for the elimination of the pattern density dependence of CMP for shallow trench isolation

    Grillaert, Joost
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    Heylen, Nancy  
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    Vrancken, Evi  
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    Badenes, Gonçal
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    Rooyackers, Rita
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    Meuris, Marc  
    Proceedings paper
    1998, Proceedings of the 3rd International Chemical-Mechanical-Planarization for ULSI Multilevel Interconnection Conference - CMP-MIC, p.313-318
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    A systematic study of trade-offs in engineering a locally strained pMOSFET

    Nouri, Faran
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    Verheyen, Peter  
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    Washington, Lori
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    Moroz, Victor
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    De Wolf, Ingrid  
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    Kawaguchi, S.
    Proceedings paper
    2004, Technical Digest International Electron Devices Meeting - IEDM, 13/12/2004, p.1055-1058
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    Accurate fin patterning in emerging devices for 32nm and beyond

    Snoeckx, Koen  
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    Rooyackers, Rita
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    Jurczak, Gosia  
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    Dixit, Abhisek
    Journal article
    2007-07, Future Fab, 23, p.68-70
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    Advanced FinFET devices for sub-32nm technology nodes: characteristics and integration challenges

    Veloso, Anabela  
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    Collaert, Nadine  
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    De Keersgieter, An  
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    Witters, Liesbeth  
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    Rooyackers, Rita
    Proceedings paper
    2009, Silicon-on-Insulator Technology and Devices 14, 24/05/2009, p.45-54
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    Advanced FinFET devices for sub-32nm technology nodes: characteristics and integration challenges

    Veloso, Anabela  
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    Collaert, Nadine  
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    De Keersgieter, An  
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    Witters, Liesbeth  
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    Rooyackers, Rita
    Meeting abstract
    2009, 215th Electrochemical Society Spring Meeting, 25/05/2009, p.935
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    Advanced semiconductor devices for future CMOS technologies

    Claeys, Cor
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    Chiappe, Daniele
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    Collaert, Nadine  
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    Mitard, Jerome  
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    Radu, Iuliana  
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    Rooyackers, Rita
    Proceedings paper
    2015, Advanced CMOS-Compatible Semiconductor Devices 17, 25/05/2015, p.49-60
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    AFM-based tomography for probing the electrical properties in confined volumes at the nanometer scale

    Schulze, Andreas
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    Hantschel, Thomas  
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    Eyben, Pierre  
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    Verhulst, Anne  
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    Rooyackers, Rita
    Meeting abstract
    2013, MRS Spring Meeting Symposium Y: Advances in Scanning Probe Microscopy for Imaging Functionality on the Nanoscale, 1/04/2013, p.Y6.01
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    An optimized poly-buffered LOCOS process for a 0.35 µm CMOS technology

    Mieville, Jean-Paul
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    Rooyackers, Rita
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    Deferm, Ludo  
    Proceedings paper
    1994, 24th European Solid State Device Research Conference - ESSDERC, 11/09/1994, p.199-202
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