Browsing by Author "Routoure, Jean-Marc"
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Publication A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Proceedings paper2013, International Conference on 1/f Noise and Fluctuations - ICNF, 24/06/2013, p.1-4Publication DC and low frequency noise performances of SOI p-FinFETs at very low temperature
Publication In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
Publication Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator MOSFETs
Proceedings paper2013, Advanced Semiconductor-on-Insulator Technology and Related Physics 16, 12/05/2013, p.49-61Publication Low frequency nosie spectroscopy in rotated UTBOX nMOSFETs
Proceedings paper2015, International Conference on Noise and Fluctuations - ICNF, 1/06/2015, p.1-4Publication Low temperature noise spectroscopy of p-channel SOI FinFETs
Proceedings paper2014, 10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI, 26/01/2014, p.1-2Publication Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
Publication Low-frequency noise in high-k and SiO2 UTBOX SOI nMOSFETs
Publication Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
; Publication Performances under saturation operation of p-channel FinFETs on SOI substrates at cryogenic temperature
Proceedings paper2014, CAS International Semiconductor Conference, 13/10/2014, p.181-184Publication Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs
Journal article2015, Physica Status Solidi C, (12) 3, p.292-298Publication Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs
Meeting abstract2014, E-MRS Spring Meeting Symposium H: Analytical Techniques for Precise Characterization of Nanomaterials - ALTECH, 26/05/2014