Browsing by Author "Ryan, Paul"

Asymmetric relaxation of SiGe in patterned Si line structures

High resolution X-ray diffraction for in-line monitoring of Ge MOSFET devices

In-line characterization of heterojunction bipolar transistor base layers by high-resolution X-ray diffraction

In-line characterization of heterojunction bipolar transistor base layers by high-resolution x-ray diffraction

Observation and understanding of anisotropic strain relaxation in selectively grown SiGe fin structures

Processing technologies for advanced Ge devices

Processing technologies for advanced Ge devices

Processing technologies for advanced Ge devices

Selective-area metal organic vapor-phase epitaxy of InGaAs/InP heterostructures on Si for advanced CMOS devices

Strain and composition monitoring in various (Si)Ge fin structures using in-line HRXRD

Strain and compositional analysis of (Si)Ge fin structures using high resolution X-ray diffraction

Use of X-ray techniques in the development and production of novel transistor structures

Use of X-ray techniques in the development of Ge MOSFET devices