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Browsing by Author "Sayan, Safak"

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    BEOL compatible WS2 transistors fully fabricated in a 300 mm pilot line

    Schram, Tom  
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    Smets, Quentin  
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    Heyne, Markus
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    Groven, Benjamin  
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    Kunnen, Eddy
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    Thiam, Arame  
    Proceedings paper
    2017, Silicon Nanoelectronics Workshop - SNW, 4/07/2017, p.139-140
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    Contact hole multiplication using grapho-epitaxy directed self-assembly: process choices, template optimization, and placement accuracy

    Bekaert, Joost  
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    Gronheid, Roel  
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    MKuppuswamy, Vijaya Kumar
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    Doise, Jan  
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    Chan, BT  
    Oral presentation
    2014, Photomask Technology (BACUS 2014)
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    Controlled sulfurization process for the synthesis of large area MoS2 films and MoS2-WS2 heterostructures

    Chiappe, Daniele
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    Asselberghs, Inge  
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    Sutar, Surajit  
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    Iacovo, Serena  
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    Afanasiev, Valeri  
    Journal article
    2016, Advanced Materials Interfaces, (3) 4, p.DOI: 10.1002/ad
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    Defectivity study on dry development rinse process (DDRP)

    Stokes, Harold  
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    De Simone, Danilo  
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    Thouroude, Yan  
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    D'Urzo, Lucia  
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    Sayan, Safak
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    Foubert, Philippe  
    Proceedings paper
    2015, International Symposium on Extreme Ultraviolet Lithography - EUVL, 5/10/2015
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    Design and benchmarking of hybrid CMOS-spin wave device circuits compared to 10nm CMOS

    Zografos, Odysseas  
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    Soree, Bart  
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    Vaysset, Adrien
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    Cosemans, Stefan  
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    Amaru, Luca
    Proceedings paper
    2015, IEEE 15th International Conference on Nanotechnology - IEEE-NANO, 27/07/2015
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    Dielectric properties of spin-on metal oxides and their applications for 2D semiconductor devices

    Sayan, Safak
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    Lin, Dennis  
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    Asselberghs, Inge  
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    Chiappe, Daniele
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    Sutar, Surajit  
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    Radu, Iuliana  
    Oral presentation
    2016, SPIE Advanced Lithography Conference
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    Directed self-assembly process integration – fin patterning

    Sayan, Safak
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    Chan, BT  
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    Marzook, Taisir
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    Vandenbroeck, Nadia  
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    Altamirano Sanchez, Efrain  
    Proceedings paper
    2015, Advances in Patterning Materials and Processes XXXII, 22/02/2015, p.94250R
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    Directed self-assembly process integration – fin patterning approaches and challenges

    Sayan, Safak
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    Chan, BT  
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    Gronheid, Roel  
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    Van Roey, Frieda  
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    Kim, Min-Soo  
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    Williamson, Lance
    Proceedings paper
    2014, Advances in Resist Materials and Processing Technology XXXI, 23/02/2014, p.90510M
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    Dry development rinse process for ultimate resolution Improvement via pattern collapse mitigation

    Sayan, Safak
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    Tao, Zheng  
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    Chan, BT  
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    De Simone, Danilo  
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    Kuwahara, Yuhei
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    Nafus, Kathleen  
    Proceedings paper
    2015, Advances in Patterning Materials and Processes XXXII, 22/02/2015, p.942516
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    DSA as a complementary lithography technique for contact hole patterning

    Gronheid, Roel  
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    Singh, Arjun  
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    Sayan, Safak
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    Vandenbroeck, Nadia  
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    Chan, BT  
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    Vandenberghe, Geert  
    Proceedings paper
    2013, EUVL Symposium, 6/10/2013
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    Enhancing etch contrast in DSA block copolymer films with sequential infiltration synthesis on 300mm Si substrates

    Singh, Arjun  
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    Sayan, Safak
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    El Otell, Ziad  
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    Chan, BT  
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    Gronheid, Roel  
    Meeting abstract
    2014, SPIE Advanced Lithography, 22/02/2015
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    Etch challenges for chemo-expitaxy Directed Self-Assembly (DSA) LiNe flow in Fin patterning

    Chan, BT  
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    Sayan, Safak
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    Marzook, Taisir
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    Altamirano Sanchez, Efrain  
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    Gronheid, Roel  
    Meeting abstract
    2016, Plasma Etch and Strip in Microtechnology - PESM, 9/05/2016
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    EUV extendibility via dry development rinse process

    Sayan, Safak
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    Tao, Zheng  
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    De Simone, Danilo  
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    Vandenberghe, Geert  
    Proceedings paper
    2016, Extreme Ultraviolet (EUV) Lithography VII, 22/02/2016, p.977610
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    Fabrication of magnetic tunnel junctions connected through a continuous free layer to enable spin logic devices

    Wan, Danny  
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    Manfrini, Mauricio  
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    Vaysset, Adrien
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    Souriau, Laurent  
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    Wouters, Lennaert  
    Journal article
    2018, Japanese Journal of Applied Physics, (57) 4S, p.04FN01
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    Graphene wires as alternative interconnects

    Asselberghs, Inge  
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    Politou, Maria
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    Soree, Bart  
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    Sayan, Safak
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    Lin, Dennis  
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    Pashaei, Parham
    Proceedings paper
    2015, IEEE International Interconnect Technology Conference and IEEE Materials for Advanced Metallization Conference - IITC/MAM, 18/05/2015, p.317-320
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    High volume manufacturing compatible dry development rinse process (DDRP): patterning and defectivity performance for EUVL

    Sayan, Safak
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    Vanelderen, Pieter  
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    Hetel, Iulian  
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    Chan, BT  
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    Raghavan, Praveen
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    Blanco, Victor  
    Proceedings paper
    2017, Extreme Ultraviolet (EUV) Lithography VIII, 26/02/2017, p.101430U
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    Impact of sequential infiltration synthesis on pattern fidelity of DSA lines

    Singh, Arjun  
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    Knaepen, Werner  
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    Sayan, Safak
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    El Otell, Ziad  
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    Chan, BT  
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    Maes, Jan  
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    Gronheid, Roel  
    Proceedings paper
    2015, Advances in Patterning Materials and Processes XXXII, 22/02/2015, p.94250N
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    Implementation of DSA for electrical test vehicles at the 7 nm node

    Gronheid, Roel  
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    Doise, Jan  
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    Bekaert, Joost  
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    Chan, BT  
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    Rincon Delgadillo, Paulina  
    Proceedings paper
    2015, E-MRS Spring Meeting, 11/05/2015
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    Integration challenges of spin torque majority gatelogic

    Wilson, Chris  
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    Manfrini, Mauricio  
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    Thiam, Arame  
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    Souriau, Laurent  
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    Babaei Gavan, Khashayar  
    Oral presentation
    2016, IEDM Special MRAM Poster
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    Integration of interconnected magnetic tunnel junctions for spin torque majority gates

    Wan, Danny  
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    Manfrini, Mauricio  
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    Souriau, Laurent  
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    Sayan, Safak
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    Jussot, Julien  
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    Swerts, Johan  
    Proceedings paper
    2017, 49th International Conferece on Solid State Devices and Materials - SSDM, 19/09/2017
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