Browsing by Author "Srividya, Vidya"
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Publication Correlation between the Vth-adjustment of nMOSFETs with HfSiO gate oxide and the energy profile of high-k bulk trap density
Journal article2010, IEEE Electron Device Letters, (31) 4, p.272-274Publication Impact of DRAM process flow on the performance of periphery devices for next generation mobile applications
Proceedings paper2011, 2nd International Workshop on Simulation and Modeling of Memory - IWSM2, 6/10/2011Publication Interpretation of PBTI/ TDDB predicted lifetime based on trap characterization by TSCIS in Vth-adjusted transistors
Proceedings paper2010, 48th Annual IEEE International Reliability Physics Symposium- IRPS, 2/05/2010, p.1078-1081Publication Ion-implantation-based low-cost Hk/MG process for CMOS low-power application
Proceedings paper2010, IEEE Symposium on VLSI Technology, 15/06/2010, p.185-186Publication Low-power DRAM-compatible replacement gate high-k/metal gate stacks
Journal article2013, Solid-State Electronics, 84, p.22-27Publication Low-power DRAM-compatible replacement gate high-k/metal gate stacks
Proceedings paper2012, 42nd European Solid-State Device Research Conference - ESSDERC, 17/09/2012, p.242-245