Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Tois, E."

Filter results by typing the first few letters
Now showing 1 - 6 of 6
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    ALD La-based oxides for Vt-tuning in high-k/metal gate stacks

    Swerts, Johan  
    ;
    Fedorenko, Yanina
    ;
    Maes, Jan  
    ;
    Tois, E.
    ;
    Delabie, Annelies  
    ;
    Ragnarsson, Lars-Ake  
    Proceedings paper
    2007, Atomic Layer Deposition Applications 3 Atomic Layer Deposition Applications 3, 7/10/2007, p.201-211
  • Loading...
    Thumbnail Image
    Publication

    ALD La2O3 cap layers on high-k gates to modify the metal gate work function

    Maes, Jan  
    ;
    Swerts, Johan  
    ;
    Tois, E.
    ;
    Delabie, Annelies  
    ;
    Adelmann, Christoph  
    ;
    Ragnarsson, Lars-Ake  
    Proceedings paper
    2007, AVS Topical Conference on Atomic Layer Deposition - ALD, 24/07/2007
  • Loading...
    Thumbnail Image
    Publication

    Atomic layer deposition of hafnium silicate from HfCl4, SiCl4, and H2O

    Fedorenko, Yanina
    ;
    Swerts, Johan  
    ;
    Maes, Jan  
    ;
    Tois, E.
    ;
    Haukka, S.
    ;
    Wang, C.G
    ;
    Wilk, G.
    Journal article
    2007, Electrochemical and Solid-State Letters, (10) 5, p.H149-H152
  • Loading...
    Thumbnail Image
    Publication

    Extreme scaled gate dielectrics by using ALD Hf-based composite materials

    Pierreux, Dieter  
    ;
    Machkaoutsan, Vladimir  
    ;
    Tois, E.
    ;
    Swerts, Johan  
    ;
    Schram, Tom  
    Meeting abstract
    2009, 216th ECS Meeting, 4/10/2009, p.2037
  • Loading...
    Thumbnail Image
    Publication

    Extreme scaled gate dielectrics by using ALD HfO2/SrTiO3 composite structures

    Pierreux, Dieter  
    ;
    Machkaoutsan, Vladimir  
    ;
    Tois, E.
    ;
    Swerts, Johan  
    ;
    Schram, Tom  
    Proceedings paper
    2009, Atomic Layer Deposition Applications 5, 4/10/2009, p.263-274
  • Loading...
    Thumbnail Image
    Publication

    Properties of HfTaxOy high-k layers deposited by ALCVD

    Zhao, Chao
    ;
    Rittersma, Z.M.
    ;
    van Berkum, J.G.M.
    ;
    Snijders, J.H.M.
    ;
    Hendriks, A.
    ;
    Breimer, P.
    Proceedings paper
    2005, Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS: New Materials, Processes, and Equipment, 15/05/2005, p.133-140

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings