Browsing by Author "Vasina, Petr"
- Results Per Page
- Sort Options
Publication 1/f noise and DLTS of LEDs
Proceedings paper1996, Proceedings 3rd ELEN Workshop, 5/11/1996, p.32-36Publication A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
Journal article1998, Microelectronics Reliability, (38) 1, p.23-27Publication A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs
Oral presentation1995, 2nd ELEN Workshop; October 25-27, 1995; Grenoble, France.Publication A low-frequency noise study of the physical hot-carrier degradation mechanisms in lowly-doped-drain Si MOSFETs
Meeting abstract1996, Belgische natuurkundige vereniging. Algemene Wetenschappelijke Vergadering, 6/06/1996, p.CM-P-36Publication Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET's
Journal article1997, IEEE Electron Device Letters, (18) 10, p.480-482Publication GRT model for random telegraph signals in MOSFETs
Proceedings paper1999, Proceedings of the 1998 van der Ziel Symposium;, p.96-101Publication High frequency RTS noise in submicron MOSFETs
Proceedings paper1996, Proceedings 3rd ELEN Workshop, 5/11/1996, p.144-149Publication Low frequency noise assessment of hot carrier stress effects in 0.7µm MOSFETs
Proceedings paper1995, Noise and Reliability of Semiconductor Devices. Proceedings of the International NODITO Workshop, 18/07/2005, p.167-171Publication Low-frequency 1/f noise behaviour of deep submicron n-MOSFETS
Proceedings paper1999, 15th International Conference on Noise in Physical Systems and 1/f Fluctuations, 23/08/1999, p.364-367Publication Low-frequency noise behaviour of high-energy electron irradiated Si n+p junction diodes
Journal article1995, IEE Electronics Letters, (31) 12, p.1016-18Publication Models for Burst and RTS Noise Mechanism in Electronic Devices
Oral presentation1995, 2nd ELEN Workshop; October 25-27, 1995; Grenoble, France.Publication Noise and THI reliability indicators for thin film resistors
Publication RTS noise and its independence on longitudinal and transverse electrical field
Proceedings paper1997, Noise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference, 14/07/1997, p.240-243Publication RTS noise in submicron MOSFETs
Oral presentation1996, 20th Workshop; May 19-22, 1996; Vilnius, Lithuania.Publication Status of NODITO project
Publication Stochastic model for the RTS noise in submicron MOSFETs
Proceedings paper1995, Noise in Physical Systems and 1/f Fluctuations - ICNF. Proceedings of the 13th International Conference, 29/05/1995, p.365-368Publication Transition intensities and noise spectra in submicron MOSFETs
Proceedings paper1997, Noise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference, 14/07/1997, p.224-227Publication Transition probabilities and noise spectra in submicron MOSFETs