Browsing by Author "Verhaege, Koen"
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Publication A compact model for the grounded-gate nMOS behaviour under CDM ESD stress
Proceedings paper1996, Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium, 10/09/1996, p.302-315Publication A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress
Journal article1998, Journal of Electrostatics, (42) 4, p.351-381Publication Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Journal article1994, Quality and Reliability Engineering International, 10, p.325-334Publication ESD protection elements during HBM stress tests - further numerical and experimental results
Publication ESD protection elements during HBM stress tests - further numerical and experimental results
Publication Fast transient ESD simulation of the NMOS protection transistor
Publication Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions
Journal article1997, IEEE Trans. Electron Devices, (44) 11, p.1972-1980Publication Influence of tester, test method and device type on CDM ESD testing
Proceedings paper1994, Proceedings 16th Annual EOS/ESD Symposium, 26/09/1994, p.49-62Publication Justifications for reducing HBM and MM ESD qualification test time
Publication NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Proceedings paper1995, Proceedings of the 6th ESREF Conference, 3/10/1995, p.117-125Publication Recommendations to further improvements of HBM ESD component level test specifications
Publication Simulation study for the CDM ESD behaviour of the grounded-gate nMOS
Journal article1996, Microelectronics and Reliability, 36, p.1739-1742