Browsing by Author "Vexler, Mikhail"

Analysis of the features of hot-carrier degradation in FinFETs

Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

Impact of the device geometric parameters on hot-carrier degradation in FinFETs

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

Physical principles of self-consistent simulation of the generation of interface states and the transport of hot charge carriers in field-effect transistors based on metal–oxide–semiconductor structures

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors