imec Institutional Repository Browsing {{ collection }} by Author "Wang, X.P."

Publication

Evidences of anodic-oxidation reset mechanism in TiN\NiO\Ni RRAM cells

Goux, Ludovic

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Degraeve, Robin

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Govoreanu, Bogdan

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Chou, H.-Y.

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Afanasiev, Valeri

Proceedings paper

2011, Symposium on VLSI Technology, 13/06/2011, p.24-25

Publication

High performance & CMOS integration friendly dual metal gate MOSFETs using TaN/Ru or TaN/W/Ru stacking multi-layers on HfLaO gate dielectric

Wang, X.P.

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Li, M.F.

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Yu, HongYu

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Yang, J.J.

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Loh, W.Y.

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Zhu, C.X.

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Du, A.Y.

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Trigg, A.D.

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Zhang, G.

Proceedings paper

2007, International Conference on Solid State Devices and Materials - SSDM, 18/09/2006

Publication

Improved electrical and reliability characteristics of HfN/HfO2 gated nMOSFET with 0.95 nm EOT fabricated using a gate-first process

Kang, JinFeng

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Yu, HongYu

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Ren, C.

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Wang, X.P.

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Li, M.F.

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Chan, D.S.H.

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Yeo, Y.C.

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Sa, N.

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Yang, H.

Journal article

2005-04, IEEE Electron Device Letters, (4) 26, p.237-239

Publication

Practical solutions to enhance EWF tunability of Ni FUSI gate electrode on HfO2

Wang, X.P.

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Yang, J.J.

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Chen, J.D.

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Xie, R.L.

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Li, M.-F.

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Zhu, C.X.

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Yu, HongYu

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Du, A.Y.

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Lim, P.C.

Proceedings paper

2007, International Conference on Solid State Devices and Materials - SSDM, 18/09/2007, p.854-855

Publication

Wide Vfb and Vth tunability for metal-gated MOS devices with HfLaO gate dielectrics

Wang, X.P.

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Yu, HongYu

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Li, M.F

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Zhu, C.X.

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Biesemans, Serge

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Chin, A.

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Sun, Y.

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Feng, Y.

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Lim, A.

Journal article

2007-04, IEEE Electron Device Letters, (28) 4, p.258-260

Publication

Widely tunable work function TaN/Ru stacking layer on HfLaO gate dielectric

Wang, X.P.

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Li, M.F.

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Yu, HongYu

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Yang, J.J.

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Chen, J.D.

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Zhu, C.X.

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Du, A.Y.

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Loh, W.Y.

Journal article

2008, IEEE Electron Device Letters, (29) 1, p.50-53

Publication

Work function tunability of refractory metal nitrides by lanthanum or aluminum doping for advanced CMOS devices

Wang, X.P.

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Lim, A.E.J.

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Yu, HongYu

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Li, M.F.

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Ren, C.

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Loh, W.Y.

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Zhu, C.X

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Chin, A.

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Trigg, A.D.

Journal article

2007, IEEE Trans. Electron Devices, (54) 11, p.2871-2877

Browsing by Author "Wang, X.P."