Browsing by Author "Wu, Wei-Min"

A 28 GHz front-end module with T/R switch achieving 17.2 dBm P-sat, 21.5% PAE(max) and 3.2 dB NF in 22 nm FD-SOI for 5G communication

Calibration and modeling of LICCDM setups

Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs

Design and Analysis of a 28 GHz T/R Front-End Module in 22-nm FD-SOI CMOS Technology

ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications

ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs

ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs

ESD protection diodes in sub-5nm gate-all-around nanosheet technologies

Interconnect Capacitance Investigation and Optimization Under I/O Pad for ESD Protection of RF/High Speed Circuits in Micro- & Nano-scale CMOS Technology

Low-impedance Contact CDM – Evaluation and Modeling

ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs

Optimization of wafer-level low-impedance contact CDM testers

RF/high-speed I/O ESD protection: Co-optimizing strategy between BEOL capacitance and HBM immunity in advanced CMOS process

Transistor Layout and Technology Impacts on ESD HBM Performance of GaN-on-SiC RF HEMTs

Wafer-Level LICCDM Device Testing