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Browsing by Author "Yoneoka, M."

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    20-MeV alpha ray effects in AlGaAsP p-HEMTs

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Kobayashi, K.
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    Yoneoka, M.
    Proceedings paper
    2000, Proceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 11/10/2000, p.133-138
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    Carrier lifetime evaluation of electron irradiated SiGe/Si diode

    Idemoto, T.
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    Ohyama, H.
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    Takakura, K.
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    Tsunoda, I.
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    Yoneoka, M.
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    Nakashima, T.
    Proceedings paper
    2010, 2nd Semiconductor Materials and Devices Forum - SMDF-2, 11/12/2010, p.154-155
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    Degradation and recovery of 1.3μm InGaAsP laser diodes irradiated by 1-MeV fast neutrons

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Kudou, T.
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    Yoneoka, M.
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    Sunaga, H.
    Oral presentation
    1999, IEEE Nuclear and Space Radiation Effects Conference - NSREC 99
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    Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation

    Matsuyama, K.
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    Hayama, K.
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    Takakura, K.
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    Yoneoka, M.
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    Ohyama, H.
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    Rafi, J.M.
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    Mercha, Abdelkarim  
    Oral presentation
    2005, 24th Electronic Materials Symposium - EMS-24
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    Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation

    Hayama, K.
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    Takakura, K.
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    Yoneoka, M.
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    Ohyama, H.
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    Rafi, J.M.
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    Mercha, Abdelkarim  
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    Simoen, Eddy  
    Journal article
    2007, Microelectronic Engineering, (84) 9_10, p.2125-2128
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    Effect of gate interface on performance degration of irradiated SiC-MESFET

    Ohyama, H.
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    Takakura, K.
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    Yoneoka, M.
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    Uemura, K.
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    Motoki, M.
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    Matsuo, K.
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    Arai, M.
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    Kuboyama, S.
    Journal article
    2007, Physica B, 401-402, p.37-40
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    Effects of mechanical stress on polycrystalline-silicon resistors

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Ikegami, M.
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    Claeys, Cor
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    Kobayashi, K.
    Journal article
    2002, Thin Solid Films, (406) 1_2, p.195-199
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    Electron irradiation of IGBTs

    Nakabayashi, M.
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    Iwata, T.
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    Ohyama, H.
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    Takakura, K.
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    Yoneoka, M.
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    Simoen, Eddy  
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    Claeys, Cor
    Oral presentation
    2004, International Conference Materials for Microelectronics and Nanoengineering
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    Impact of 20-MeV alpha ray irradiation on V-band performance of AlGaAs pseudomorphic HEMTs

    Ohyama, Hidenori
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    Yajima, K.
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    Simoen, Eddy  
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    Kato, T.
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    Claeys, Cor
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    Takami, Y.
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    Kobayashi, K.
    Journal article
    2000, IEEE Trans. Nuclear Science, (47) 6, p.2546-2550
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    Impact of induced lattice defects on performance degradation of AlGaAs/GaAs p-HEMTs

    Hakata, T.
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    Ohyama, Hidenori
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    Kuroda, S.
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    Simoen, Eddy  
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    Claeys, C.
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    Kudou, T.
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    Kobayashi, K.
    Journal article
    1999, Physica B, 274, p.1034-1036
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    Impact of neutron irradiation on optical performance of InGaAsP laser diodes

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
    ;
    Takami, Y.
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    Sunaga, H.
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    Yoneoka, M.
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    Nakabayashi, M.
    Journal article
    2000, Thin Solid Films, (364) 1_2, p.259-263
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    Influence of boron implantation dose on the mechanical stress in polycrystalline silicon films

    Nakabayashi, M.
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    Ikegami, M.
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    Ohyama, Hidenori
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    Kobauashi, K.
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    Yoneoka, M.
    ;
    Simoen, Eddy  
    Proceedings paper
    2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.85-88
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    Influence of mechanical stress on the electrical performance of polycrystalline-silicon resistors

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Kobayashi, K.
    ;
    Yoneoka, M.
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    Simoen, Eddy  
    ;
    Claeys, C.
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    Takami, Y.
    Oral presentation
    2000, MRS Spring Meeting 2000. Symposium A:Amorphous and Heterogeneous Silicon Thin Films - 2000; 24-28 April 2000; San Francisco, Ca,
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    Investigation of the electrical properties of carbon doped Si0.75Ge0.25/Si hetero junction diodes by 2 MeV electron irradiation

    Takakura, Kenichiro  
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    Ogata, H.
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    Inoue, T.
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    Yoneoka, M.
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    Tsunoda, I.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2015, 28th International Conference on Defects in Semiconductors - ICDS, 27/07/2015
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    Mechanical stress of the electrical performance of polycrystalline-silicon resistors

    Nakabayashi, N.
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Ikegami, M.
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    Claeys, Cor
    ;
    Kobayashi, K.
    Journal article
    2001, Journal of Materials Research, (16) 9, p.2579-2582
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    Radiation damage of n-MOSFETs fabricated in a BiCMOS process

    Ohyama, Hidenori
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    Kobayashi, K.
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    Nakabayashi, M.
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    Simoen, Eddy  
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    Claeys, Cor
    ;
    Takami, Y.
    Proceedings paper
    2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.107-110
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    Radiation damage of N-MOSFETS fabricated in a BiCMOS process

    Kobayashi, K.
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    Ohyama, Hidenori
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    Yoneoka, M.
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    Hayama, Kiyoteru
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    Nakabayashi, M.
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    Simoen, Eddy  
    Journal article
    2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.227-230
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    Radiation damage of Si1-xGex S/D p-MOSFETs with different Ge concentrations

    Nakashima, T.
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    Idemoto, T.
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    Tsunoda, I.
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    Takakura, K.
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    Yoneoka, M.
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    Ohyama, H.
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    Yoshino, K.
    Journal article
    2012, Thin Solid Films, 520, p.3337-3340
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    Radiation damages of SiGe devices by electron irradiation and their thermally recovery bahavior

    Nakashima, T.
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    Idemoto, T.
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    Takakura, K.
    ;
    Tsunoda, I.
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    Yoneoka, M.
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    Ohyama, H.
    ;
    Yoshino, K.
    Proceedings paper
    2010, 2nd Semiconductor Materials and Devices Forum - SMDF-2, 11/12/2010, p.56-59
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    Radiation hardness of electrical properties of n-channel UTBOX SOI by 2 MeV electron irradiation

    Takakura, Kenichiro  
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    Goto, T.
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    Yoneoka, M.
    ;
    Tsunoda, I.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Oral presentation
    2015, 28th International Conference on Defects in Semiconductors - ICDS
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