Browsing by author "Petrichuk, M."
Now showing items 1-20 of 20
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Back and front interface related generation-recombination noise in buried-channel SOI p-MOSFET's
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, Cor (1996) -
Electrical characterisation of shallow cobalt-silicided junctions
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Czerwinski, A.; Katcki, J.; Ratajczak, J.; Gaubas, Eugenijus (2000) -
Electrical characterization of shallow cobalt-silicided junctions
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Czerwinski, A.; Katcki, J.; Ratajczak, J.; Gaubas, Eugenijus (2001) -
Evidence for a "linear kink effect" in ultra-thin gate oxide SOI MOSFETs
Mercha, Abdelkarim; Rafi, Joan Marc; Simoen, Eddy; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N. (2003) -
Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs
Simoen, Eddy; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Martino, Joao Antonio; Sonnenberg, V. (1996) -
Flicker noise in deep submicron nMOS transistors
Lukyanchikova, N.; Garbar, N.; Petrichuk, M.; Simoen, Eddy; Claeys, Cor (2000) -
Flicker noise in submicron MOSFETS with 3.5 nm nitrided gate oxide
Simoen, Eddy; Da Rold, Martina; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N. (2001) -
Interface defects of the new type detected by the noise method in SOI and SOS MOSFETs
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, Cor (1997) -
Interface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETs
Claeys, Cor; Simoen, Eddy; Lukyanchikova, N.; Petrichuk, M.; Garbar, N. (1994) -
Lorentzian noise in ultra-thin gate oxide SOI MOSFETs observed under conditions of a linear kink effects
Lukyanchikova, N.; Garbar, N.; Petrichuk, M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2003) -
Low-frequency 1/f noise behaviour of deep submicron n-MOSFETS
Simoen, Eddy; Biesemans, Serge; Claeys, Cor; De Meyer, Kristin; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Kolarova, Renata; Vasina, Petr; Sikula, J. (1999) -
Low-Frequency Noise in SOI p-MOSFETs Prepared on SIMOX and ZMR Substrates
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1995) -
On the origin of the 1/f1.7 noise in deep submicron partially depleted SOI transistors
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Mercha, Abdelkarim; van Meer, Hans; De Meyer, Kristin; Claeys, Cor (2002) -
On the physical mechanisms responsible for a novel class of floating body effects in silicon-on-insulator MOSFETs
Mercha, Abdelkarim; Rafi, Joan Marc; Simoen, Eddy; Claeys, Cor; Lukyanchikiva, N.; Petrichuk, M.; Garbar, N. (2003) -
Problems of low-frequency noise in depletion mode pMOSFETs under inversion conditions
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1996) -
Results of noise examination of fully-depleted accumulation-mode SOI pMOSFETs
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1995) -
RTS noise due to lateral isolation related defects in submicron
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1998) -
Strong low-frequency noise in buried-channel pMOSFETs under inverse conditions
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, Cor (1996) -
Strong low-frequency noise in buried-channel pMOSFETs under inversion conditions
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, Cor (1994) -
The 1/f1.7 noise in submicron SOI MOSFETs with 2.5 nm nitrided oxide
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor; van Meer, Hans; De Meyer, Kristin (2002)