Browsing by author "Van Houdt, Jan"
Now showing items 61-80 of 358
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Compact Modeling of Multidomain Ferroelectric FETs: Charge Trapping, Channel Percolation, and Nucleation-Growth Domain Dynamics
Xiang, Yang; Garcia Bardon, Marie; Kaczer, Ben; Alam, Md Nur Kutubul; Ragnarsson, Lars-Ake; Kaczmarek, Kuba; Parvais, Bertrand; Groeseneken, Guido; Van Houdt, Jan (2021) -
Comparative reliability investigation of different nitride based local charge trapping memory devices
Breuil, Laurent; Haspeslagh, Luc; Blomme, Pieter; Lorenzini, Martino; Wellekens, Dirk; De Vos, Joeri; Van Houdt, Jan (2005) -
Comparison of scaled floating body RAM architectures
Collaert, Nadine; Rosmeulen, Maarten; Rakowski, Michal; Rooyackers, Rita; Witters, Liesbeth; Veloso, Anabela; Van Houdt, Jan; Jurczak, Gosia (2008) -
Comparison of the suitability of various programming mechanisms used for multilevel non-volatile information storage
Montanari, Donato; Van Houdt, Jan; Wellekens, Dirk; Hendrickx, Paul; Groeseneken, Guido; Maes, Herman (1996) -
Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
Chang, Ting-Yu; Wang, Kuan-Chi; Liu, Hsien-Yang; Hseun, Jing-Hua; Peng, Wei-Cheng; Ronchi, Nicolo; Celano, Umberto; Banerjee, Kaustuv; Van Houdt, Jan; Wu, Tian-Li (2023) -
Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
Maconi, Alessandro; Arreghini, Antonio; Monzio Compagnoni, Christian; Van den Bosch, Geert; Spinelli, Alessandro S.; Van Houdt, Jan; Lacaita, Andrea L. (2012) -
Comprehensive understanding of charge lateral migration in 3D SONOS memories
Liu, Lifang; Arreghini, Antonio; Van den Bosch, Geert; Pan, Liyang; Van Houdt, Jan (2016) -
Concepts of advanced nonvolatile memory devices
Jurczak, Gosia; Van Houdt, Jan; Wouters, Dirk (2009) -
Corner enhancement of FNT program/erase operations in nitride storage FinFlash devices
Breuil, Laurent; Rosmeulen, Maarten; Loo, Josine; Furnemont, Arnaud; Haspeslagh, Luc; Van Houdt, Jan (2007) -
Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness
Poliakov, Pavel; Blomme, Pieter; Miranda Corbalan, Miguel; Van Houdt, Jan; Dehaene, Wim (2011-05) -
Defect profiling in FEFET Si:HfO2 layers
O'Sullivan, Barry; Putcha, Vamsi; Izmailov, Roman; Afanas'ev, Valeri V.; Simoen, Eddy; Jung, Taehwan; Higashi, Yusuke; Degraeve, Robin; Truijen, Brecht; Kaczer, Ben; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Clima, Sergiu; Breuil, Laurent; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2020) -
Defect profiling in the SiO2/Al2O3 interface using variable Tcharge-Tdischarge amplitude charge pumping (VT2ACP)
Zahid, Mohammed; Degraeve, Robin; Cho, Moon Ju; Pantisano, Luigi; Van Houdt, Jan; Groeseneken, Guido; Jurczak, Gosia; Ruiz Aguado, Daniel (2009) -
Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Zahid, Mohammed; Degraeve, Robin; Tang, Baojun; Lisoni, Judit; Van den Bosch, Geert; Van Houdt, Jan; Breuil, Laurent; Blomme, Pieter; Arreghini, Antonio (2014) -
Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman (1996) -
Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors
Ravsher, Taras; Fantini, Andrea; Vaisman Chasin, Adrian; Houshmand Sharifi, Shamin; Hody, Hubert; Dekkers, Harold; Witters, Thomas; Van Houdt, Jan; Afanas'ev, Valeri; Couet, Sebastien; Kar, Gouri Sankar (2022) -
Demonstration of 2e12/cm-2-eV-1 2D-oxide interface trap density on back-gated MoS2 flake devices with 2.5nm EOT
Gaur, Abhinav; Balaji, Yashwanth; Lin, Dennis; Adelmann, Christoph; Van Houdt, Jan; Heyns, Marc; Mocuta, Dan; Radu, Iuliana (2017) -
Demonstration of 64 Conductance States and Large Dynamic Range in Sidoped HfO2 FeFETs under Neuromorphic Computing Operations
Wang, Yu-Yun; Wang, Kuang-Chi; Wu, Cheng-Hung; Chang, Ting-Yu; Ronchi, Nicolo; Banerjee, Kaustuv; Van den Bosch, Geert; Van Houdt, Jan; Wu, Tian-Li (2022-04-18) -
Deterministic and field-free voltage-controlled MRAM for high performance and low power applications
Wu, Jackson; Kim, Woojin; Garello, Kevin; Yasin, Farrukh; Jayakumar, Ganesh; Couet, Sebastien; Carpenter, Robert; Kundu, Shreya; Rao, Siddharth; Crotti, Davide; Van Houdt, Jan; Groeseneken, Guido; Kar, Gouri Sankar (2020) -
Device and materials options for charge trap NAND Flash memory
Van den Bosch, Geert; Van Houdt, Jan (2009) -
Dielectric Response in Ferroelectrics Near Polarization Switching: Analytical Calculations, First-Principles Modeling, and Experimental Verification
Clima, Sergiu; Verhulst, Anne; Bagul, Pratik; Truijen, Brecht; McMitchell, Sean; De Wolf, Ingrid; Pourtois, Geoffrey; Van Houdt, Jan (2022)