Browsing by author "Van Houdt, Jan"
Now showing items 81-100 of 358
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Direct three-dimensional observation of the conduction in poly-Si and In1-xGaxAs 3D NAND vertical channels
Celano, Umberto; Capogreco, Elena; Lisoni, Judit; Arreghini, Antonio; Kunert, Bernardette; Guo, Weiming; Van den Bosch, Geert; Van Houdt, Jan; De Meyer, Kristin; Furnemont, Arnaud; Vandervorst, Wilfried (2016) -
Distribution and generation of traps in SiO2/Al2O3 gate stacks
Crupi, I.; Degraeve, Robin; Govoreanu, Bogdan; Brunco, David; Roussel, Philippe; Van Houdt, Jan (2007) -
Does a universal memory make sense?
Van Houdt, Jan (2005) -
Doped GeSe materials for selector applications
Avasarala, Naga Sruti; Govoreanu, Bogdan; Opsomer, Karl; Devulder, Wouter; Clima, Sergiu; Detavernier, Christophe; van der Veen, Marleen; Van Houdt, Jan; Heyns, Marc; Goux, Ludovic; Kar, Gouri Sankar (2017) -
Effect of Al203 morphology on the erase saturation performance in SANOS-type memory cells
Cacciato, Antonio; Furnemont, Arnaud; Breuil, Laurent; De Vos, Joeri; Haspeslagh, Luc; Van Houdt, Jan (2007) -
Effect of high temperature annealing on tunnel oxide properties in TANOS devices
Arreghini, Antonio; Zahid, Mohammed; Van den Bosch, Geert; Suhane, Amit; Breuil, Laurent; Cacciato, Antonio; Van Houdt, Jan (2011) -
Effect of top dielectric morphology and gate material on the performance of nitride-based FLASH memory cells
Cacciato, Antonio; Breuil, Laurent; Van den Bosch, Geert; Richard, Olivier; Rothschild, Aude; Furnemont, Arnaud; Bender, Hugo; Kittl, Jorge; Van Houdt, Jan (2008) -
Electrical and physical characterization of Polycrystalline III-V compounds
Capogreco, Elena; Lisoni, Judit; Merckling, Clement; Numata, Toshinori; Arreghini, Antonio; De Meyer, Kristin; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Electrical defects in dielectrics for flash memories studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIC)
Degraeve, Robin; Cho, Moon Ju; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Van den Bosch, Geert; Van Houdt, Jan; Jurczak, Gosia; Groeseneken, Guido (2009) -
Electrical Investigation of Wake-Up in High Endurance Fatigue-Free La and Y Doped HZO Meal-Ferroelectric-Metal Capacitors
Walke, Amey; Popovici, Mihaela Ioana; Banerjee, Kaustuv; Clima, Sergiu; Kumbhare, Pankaj; Desmet, Johan; Meersschaut, Johan; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar; Van Houdt, Jan (2022-07-12) -
Electron trap profiling near Al2O3/ gate interface in TANOS stack using gate-side-trap spectroscopy by charge injection and sensing
Zahid, Mohammed; Arreghini, Antonio; Degraeve, Robin; Govoreanu, Bogdan; Suhane, Amit; Van Houdt, Jan (2010) -
Electron trapping in HfAI0 high-k stack for Flash memory applications: an origin of Vth window closure during cyclling operations
Zheng, X.F.; Robinson, Colin; Zhang, W.D.; Zhang, Jian Fu; Govoreanu, Bogdan; Van Houdt, Jan (2011-05) -
Elucidating possible crystallographic origins of wake-up mechanisms in ferroelectric hafnia
McMitchell, Sean; Clima, Sergiu; Ronchi, Nicolo; Banerjee, Kaustuv; Celano, Umberto; Popovici, Mihaela Ioana; Di Piazza, Luca; Van den Bosch, Geert; Van Houdt, Jan (2021) -
Embedded HIMOS® Flash Memory in 0.35 μm and 0.25 μm CMOS Technologies
Wellekens, Dirk; Van Houdt, Jan; Haspeslagh, Luc; Tsouhlarakis, Jorgo; Hendrickx, Paul; Deferm, Ludo; Maes, Herman (2000) -
Emerging NVM technologies
Van Houdt, Jan (2004) -
Endurance of ferroelectric La-doped HfO2 for SFS gate-stack memory devices
Ronchi, Nicolo; McMitchell, Sean; Min, Jinhong; Banerjee, Kaustuv; Van den Bosch, Geert; Shin, Changhwan; Van Houdt, Jan (2020) -
Energy and spatial distributions of electron traps throughout Sio2/Al2O3 stacks as the IPD in flash memory application
Zheng, X.F.; Zhang, W.D.; Govoreanu, Bogdan; Ruiz Aguado, Daniel; Zhang, .F.; Van Houdt, Jan (2010) -
Enhanced tunneling current effect for nonvolatile memory applications
Govoreanu, Bogdan; Blomme, Pieter; Van Houdt, Jan; De Meyer, Kristin (2002) -
Enhanced tunneling current effect for nonvolatile memory applications
Govoreanu, Bogdan; Blomme, Pieter; Van Houdt, Jan; De Meyer, Kristin (2003-04) -
Evaluating the Effects of FeFET Device Variability on Charge Sharing Based AiMC Accelerator
Majumdar, Swatilekha; Cosemans, Stefan; Mallik, Arindam; Debacker, Peter; Catthoor, Francky; Van Houdt, Jan (2023)