Browsing by author "Deleu, Jeroen"
Now showing items 1-20 of 21
-
Accurate determination of Si sputter yield in the transient region
Deleu, Jeroen; Brijs, Bert; Vandervorst, Wilfried (1999) -
Advanced capabilities and applications of a sputter-RBS system
Brijs, Bert; Deleu, Jeroen; Beyer, Gerald; Vandervorst, Wilfried (1998) -
Advanced capabilities and applications of a sputter-RBS system
Brijs, Bert; Deleu, Jeroen; Beyer, Gerald; Vandervorst, Wilfried (1999) -
Advanced RBS analysis of thin films in micro-electronics
Brijs, Bert; Deleu, Jeroen; Huygebaert, C.; Nauwelaerts, Sophie; Vandervorst, Wilfried; Kimura, K. (2000) -
Advanced RBS analysis of thin films in micro-electronics
Brijs, Bert; Deleu, Jeroen; Huyghebaert, Cedric; Nauwelaerts, Sophie; Nakajima, K.; Kimura, K.; Vandervorst, Wilfried (2001) -
ARIBA, An All Round Ion Beam Acquisition Program
Brijs, Bert; De Coster, Walter; Deleu, Jeroen; Vandervorst, Wilfried; Wils, D.; Vandesteene, N. (1994) -
ARIBA, an all round ion beam acquisition program
Brijs, Bert; Deleu, Jeroen; De Coster, Walter; Wills, D.; Vandervorst, Wilfried (1997) -
Characterization of ultra thin layers by Rutherford backscattering spectrometry
Brijs, Bert; Deleu, Jeroen; Conard, Thierry; Li, H.; Loo, Roger; Caymax, Matty; Nakajima, K.; Kimura, K.; Vandervorst, Wilfried (1999) -
Characterization of ultra thin oxynitrides, a general approach
Brijs, Bert; Deleu, Jeroen; Conard, Thierry; De Witte, Hilde; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Genchev, I.; Bergmaier, A.; Goergens, I.; Neumaier, P.; Dollinger, G.; Dobeli, M. (1999) -
Characterization of ultra thin oxynitrides: a general approach
Brijs, Bert; Deleu, Jeroen; Conard, Thierry; De Witte, Hilde; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Genchev, I.; Bermaier, A.; Goergens, L.; Neumaier, P.; Dollinger, G.; Döbeli, M. (2000) -
Elastic recoil detection of hydrogen in combination with low energy argon sputtering
Brijs, Bert; Deleu, Jeroen; Van Beeck, W.; Vandervorst, Wilfried (1997) -
In situ observation by RBS of oxygen gettering during Cs sputtering of Si-based materials
De Coster, Walter; Brijs, Bert; Deleu, Jeroen; Alay, Josep Lluis; Vandervorst, Wilfried (1996) -
Qualitative determination of the altered layer as a function of ion fluence: buildup, thickness and composition
Deleu, Jeroen; Brijs, Bert; Vandervorst, Wilfried (1999) -
SPECTAC, a fully ethernet controlled Spectrum Acquisition Program for RBS, PIXE and NRA
Brijs, Bert; Deleu, Jeroen; Melaet, Stefan; Loonen, Barbara; Vandervorst, Wilfried; Strathman, M. (1998) -
Stoichiometric changes of Si, CoSi2 and TiSi2 during low energy oxygen bombardment in combination with oxygen bleed-in
Brijs, Bert; Deleu, Jeroen; Storm, Wolfgang; De Coster, Walter; Vandervorst, Wilfried (1996) -
Study of the transient phenomena in SIMS depth profiling using combined SIMS-RBS
Deleu, Jeroen; Brijs, Bert; Vandervorst, Wilfried (1997) -
Study of the transient phenomena in SIMS depth profiling using combined SIMS-RBS
Deleu, Jeroen; Brijs, Bert; Vandervorst, Wilfried (1998) -
The behaviour of Si and CoSi2 during low energy nitrogen bombardment, with and without O-2 flooding
Deleu, Jeroen; Brijs, Bert; Storm, Wolfgang; Vandervorst, Wilfried; De Coster, Walter (1996) -
Transient phenomena of silicon under oxygen bombardment
Deleu, Jeroen; Brijs, Bert; Vandervorst, Wilfried (1998) -
Transient sputter yields of silicon with and without oxygen flooding
Deleu, Jeroen; Brijs, Bert; Vandervorst, Wilfried (1998)