Browsing by author "Ruiz Aguado, Daniel"

A novel trapping/detrapping model for defect profiling in high-k materials using the two-pulse capacitance-voltage technique

Ruiz Aguado, Daniel; Govoreanu, Bogdan; Zhang, W.D.; Jurczak, Gosia; De Meyer, Kristin; Van Houdt, Jan (2010)

Analysis and modeling of new dielectric materials

Ruiz Aguado, Daniel (2011-06)

Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability

Zahid, Mohammed; Ruiz Aguado, Daniel; Degraeve, Robin; Wang, W.C; Govoreanu, Bogdan; Toledano Luque, Maria; Afanasiev, V.V.; Van Houdt, Jan (2010)

Defect profiling in the SiO2/Al2O3 interface using variable Tcharge-Tdischarge amplitude charge pumping (VT2ACP)

Zahid, Mohammed; Degraeve, Robin; Cho, Moon Ju; Pantisano, Luigi; Van Houdt, Jan; Groeseneken, Guido; Jurczak, Gosia; Ruiz Aguado, Daniel (2009)

Energy and spatial distributions of electron traps throughout Sio2/Al2O3 stacks as the IPD in flash memory application

Zheng, X.F.; Zhang, W.D.; Govoreanu, Bogdan; Ruiz Aguado, Daniel; Zhang, .F.; Van Houdt, Jan (2010)

Impact of the high-temperature process steps on the HfAIO interpoly dielectric stacks for nonvolatile memory applications

Ruiz Aguado, Daniel; Govoreanu, Bogdan; Favia, Paola; De Meyer, Kristin; Van Houdt, Jan (2008-03)

Investigation of aggressively scaled HfALOx-based interpoly dielectric stacks for sub-45nm nonvolatile memory technologies

Govoreanu, Bogdan; Wellekens, Dirk; Haspeslagh, Luc; Brunco, David; De Vos, Joeri; Ruiz Aguado, Daniel; Blomme, Pieter; van der Zanden, Koen; Van Houdt, Jan (2007)