Browsing by author "Ke, Xiaoxing"
Now showing items 1-13 of 13
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3D analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artefacts
Ke, Xiaoxing; Bals, Sarah; Cott, Daire; Hantschel, Thomas; Bender, Hugo; Van Tendeloo, Gustaaf (2010) -
Can carbon nanotubes be preserved during FIB preparation of TEM samples?
Ke, Xiaoxing; Bals, Sara; Van Tenderloo, Gustaaf; Romo Negreira, Ainhoa; Hantschel, Thomas; Bender, Hugo (2008) -
Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB?
Ke, Xiaoxing; Bals, Sara; Romo Negreira, Ainhoa; Hantschel, Thomas; Bender, Hugo; Van Tendeloo, Gustaaf (2008-09) -
Electrical and structural characterization of 150 nm CNT contacts with Cu damascene top metallization
van der Veen, Marleen; Vereecke, Bart; Masahito, Sugiura; Kashiwagi, Yusaku; Ke, Xiaoxing; Cott, Daire; Vanpaemel, Johannes; Vereecken, Philippe; De Gendt, Stefan; Huyghebaert, Cedric; Tokei, Zsolt (2012) -
Electrical characterization of carbon nanotube based interconnects
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Dathe, Andre; Nazir, Aftab; Mody, Jay; Celano, Umberto; Ke, Xiaoxing; Vandervorst, Wilfried (2011) -
Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects
Schulze, Andreas; Hantschel, Thomas; Dathe, Andre; Eyben, Pierre; Ke, Xiaoxing; Vandervorst, Wilfried (2012-07) -
From 2D to 3D: FIB sample preparation for carbon nanotube interconnects
Ke, Xiaoxing; Bals, Sarah; Romo Negreira, Ainhoa; Cott, Daire; Hantschel, Thomas; Bender, Hugo; Van Tendeloo, Gustaaf (2010) -
Structural and electrical characterization of carbon nanotube interconnects by combined transmission electron microscopy and scanning spreading resistance microscopy
Hantschel, Thomas; Ke, Xiaoxing; Chiodarelli, Nicolo; Schulze, Andreas; Bender, Hugo; Eyben, Pierre; Bals, Sara; Vandervorst, Wilfried (2011) -
TEM sample preparation by FIB for carbon nanotube interconnects
Ke, Xiaoxing; Bals, Sara; Romo Negreira, Ainhoa; Hantschel, Thomas; Bender, Hugo; Van Tendeloo, Gustaaf (2009) -
TEM study of carbon nanotube interconnects
Ke, Xiaoxing; Chiodarelli, Nicolo; van der Veen, Marleen; Vereecke, Bart; Hantschel, Thomas; Bals, S.; Van Tendeloo, G. (2011) -
Three-dimensional electrical profiling of carbon nanotube interconnects
Hantschel, Thomas; Schulze, Andreas; Dathe, Andre; Eyben, Pierre; van der Veen, Marleen; Vereecke, Bart; Ke, Xiaoxing; Vandervorst, Wilfried (2012) -
Unconventional Giant "Magnetoresistance" in Bosonic Semiconducting Diamond Nanorings
Zhang, Gufei; Zulkharnay, Ramiz; Ke, Xiaoxing; Liao, Meiyong; Liu, Liwang; Guo, Yujie; Li, Yejun; Rubahn, Horst-Guenter; Moshchalkov, Victor V.; May, Paul W. (2023) -
Wafer level electrical evaluation of vertical carbon nanotube bundles as a function of the growth temperature
Vereecke, Bart; van der Veen, Marleen; Sugiura, Masahito; Kashiwagi, Yusaku; Ke, Xiaoxing; Cott, Daire; Hantschel, Thomas; Huyghebaert, Cedric; Tokei, Zsolt (2013)