Browsing by author "De Wolf, Peter"
Now showing items 1-20 of 56
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2D profiling with atomic force microscopy
Trenkler, Thomas; De Wolf, Peter; Stephenson, Robert; Clarysse, Trudo; Hantschel, Thomas; Vandervorst, Wilfried (1999) -
AFMs reveal 3-D semiconductor features
De Wolf, Peter; Chollet, Frederic; Vandervorst, Wilfried (1995) -
Carrier Profile Determination in Device Structures using AFM-Based Methods
Vandervorst, Wilfried; De Wolf, Peter; Clarysse, Trudo; Trenkler, Thomas; Hellemans, L.; Snauwaerts, Jan; Raineri, Vito (1995) -
Characterization of a point-contact on silicon using force microscopy-supported resistance measurements
De Wolf, Peter; Snauwaerts, Jan; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (1995) -
Characterization of silicon cantilevers with integrated pyramidal tips in atomic force microscopy
Hantschel, Thomas; Stephenson, Robert; Trenkler, Thomas; De Wolf, Peter; Vandervorst, Wilfried (1999) -
Comparison of two-dimensional carrier profiles in metal-oxide-semiconductor field-effect transistor structures obtained with scanning spreading resistance microscopy and inverse modeling
De Wolf, Peter; Vandervorst, Wilfried; Smith, H.; Khalil, N. (2000) -
Contrast reversal in scanning capacitance microscopy imaging
Stephenson, Robert; Verhulst, Anne; De Wolf, Peter; Caymax, Matty; Vandervorst, Wilfried (1998) -
Cross-sectional nano-spreading resistance profiling
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L.; Niedermann, P.; Hänni, W. (1998) -
Cross-sectional nano-srp dopant profiling
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L.; Niedermann, P.; Hanni, W. (1997) -
Direct measurement of Leff and channel profile in MOSFETs using 2-D carrier profiling techniques
De Wolf, Peter; Stephenson, Robert; Biesemans, Serge; Jansen, Philippe; Badenes, Gonçal; De Meyer, Kristin; Vandervorst, Wilfried (1998) -
Dopant/carrier profiling for ULSI
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert (1998) -
Electrical characterization of submicrometer silicon devices by cross-sectional contact-mode AFM
De Wolf, Peter; Trenkler, Thomas; Clarysse, Trudo; Caymax, Matty; Vandervorst, Wilfried; Snauwaert, J.J.; Hellemans, L. (1996) -
Electrical scanning probe techniques in semiconductor research
Trenkler, Thomas; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Stephenson, Robert; Hantschel, Thomas; Vandervorst, Wilfried (1999) -
Epitaxial staircase structure for the calibration of electrical characterisation techniques
Clarysse, Trudo; Caymax, Matty; De Wolf, Peter; Trenkler, Thomas; Vandervorst, Wilfried; McMurray, J. S.; Kim, J.; Williams, C. C.; Clark, J G.; Neubauer, G. (1997) -
Epitaxial staircase structure for the calibration of electrical characterization techniques
Clarysse, Trudo; Caymax, Matty; De Wolf, Peter; Trenkler, Thomas; Vandervorst, Wilfried; McMurray, J. S.; Kim, J.; Williams, C. C.; Clark, J. G.; Neubauer, G. (1998) -
Evaluating probes for "electrical" atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; De Wolf, Peter; Hellemans, L.; Vandervorst, Wilfried; Malavé, A.; Büchel, D.; Oesterschulze, E.; Kulisch, W.; Niedermann, P.; Sulzbach, T.; Ohlsson, O. (1999) -
Evaluating probes for "electrical" atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L.; Malavé, A.; Büchel, D.; Oesterschulze, E.; Kulisch, W.; Niedermann, P.; Sulzbach, T.; Ohlsson, O. (2000) -
Fabrication and use of metal tip and tip-on-tip probes for AFM-based device analysis
Hantschel, Thomas; De Wolf, Peter; Trenkler, Thomas; Stephenson, Robert; Vandervorst, Wilfried (1998) -
High resolution dopant/carrier profiling for deep submicron technologies
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Xu, Mingwei; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; Conard, Thierry; De Witte, Hilde (1999) -
Intercomparison of 2-D carrier profiles in MOSFET structures obtaind with scanning resistance microscopy and inverse modeling
De Wolf, Peter; Vandervorst, Wilfried; Smith, H.; Khalil, N. (1999)