Browsing by author "Noh, Kyung Bong"
Now showing items 1-13 of 13
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A low-power HKMG CMOS platform compatible with DRAM node 2x and beyond
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Aoulaiche, Marc; Cho, Moon Ju; Noh, Kyung Bong; Son, Yunik; Na, Hoon Jo; Kauerauf, Thomas; Douhard, Bastien; Nazir, Aftab; Chew, Soon Aik; Milenin, Alexey; Altamirano Sanchez, Efrain; Schoofs, Geert; Albert, Johan; Sebaai, Farid; Vecchio, Emma; Paraschiv, Vasile; Vandervorst, Wilfried; Lee, Sun Ghil; Collaert, Nadine; Fazan, Pierre; Horiguchi, Naoto; Thean, Aaron (2014) -
A new high-k/metal gate CMOS integration scheme (Diffusion and Gate Replacement) suppressing gate height asymmetry and compatible with high-thermal budget memory technologies
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Cho, Moon Ju; Simoen, Eddy; Aoulaiche, Marc; Albert, Johan; Chew, Soon Aik; Noh, Kyung Bong; Son, Yunik; Fazan, Pierre; Horiguchi, Naoto; Thean, Aaron (2014) -
Assessment of SiGe quantum well transistors for DRAM peripheral applications
Ritzenthaler, Romain; Schram, Tom; Eneman, Geert; Mocuta, Anda; Horiguchi, Naoto; Thean, Aaron; Spessot, Alessio; Aoulaiche, Marc; Fazan, Pierre; Noh, Kyung Bong; Son, Yunik (2015) -
Diffusion and gate replacement: a new gate-first high-k/metal gate CMOS integration scheme suppressing gate height symmetry
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Cho, Moon Ju; Simoen, Eddy; Aoulaiche, Marc; Albert, Johan; Chew, Soon Aik; Noh, Kyung Bong; Son, Yunik; Mitard, Jerome; Mocuta, Anda; Horiguchi, Naoto; Fazan, Pierre; Thean, Aaron (2016) -
I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration
Ritzenthaler, Romain; Schram, Tom; Cho, Moon Ju; Mocuta, Anda; Horiguchi, Naoto; Thean, Aaron; Spessot, Alessio; Caillat, Christian; Aoulaiche, Marc; Fazan, Pierre; Noh, Kyung Bong; Son, Yunik (2015) -
Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors
Aoulaiche, Marc; Federico, Antonio; Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Arimura, Hiroaki; Cho, Moon Ju; Kauerauf, Thomas; Crupi, Felice; Spessot, Alessio; Caillat, Christian; Fazan, Pierre; Na, Hoon Joo; Son, Yunik; Noh, Kyung Bong; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron (2013) -
Impact of thermal budget on the low-frequency noise of DRAM peripheral nMOSFETs
Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Aoulaiche, Marc; Fazan, Pierre; Na, Hoon Joo; Lee, Sun Ghil; Son, Yunik; Noh, Kyung Bong; Horiguchi, Naoto; Thean, Aaron; Claeys, Cor (2015) -
Improved sidewall doping with small implant angle by AsH3 Ion assisted deposition and doping process for scaled NMOS Si bulk FinFETs
Sasaki, Yuichiro; Godet, Ludovic; Chiarella, Thomas; Brunco, David; Rockwell, Tyler; Lee, Jae Woo; Colombeau, Benjamin; Togo, Mitsuhiro; Chew, Soon Aik; Zschaetzsch, Gerd; Noh, Kyung Bong; De Keersgieter, An; Boccardi, Guillaume; Kim, Min-Soo; Hellings, Geert; Martin, Patrick; Vandervorst, Wilfried; Thean, Aaron; Horiguchi, Naoto (2013) -
Low-frequency noise analysis of DRAM peripheral transistors with La cap
Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Aoulaiche, Marc; Spessot, Alessio; Fazan, Pierre; Na, Hai Sub; Son, Yunik; Noh, Kyung Bong; Arimura, Hiroaki; Horiguchi, Naoto; Thean, Aaron; Claeys, Cor (2014) -
Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
Simoen, Eddy; Federico, Antonio; Aoulaiche, Marc; Ritzenthaler, Romain; Schram, Tom; Arimura, Hiroaki; Cho, Moon Ju; Kauerauf, Thomas; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron; Crupi, Felice; Spessot, Alessio; Caillat, Chirstian; Fazan, Pierre; Na, Hoon Joo; Son, Yunik; Noh, Kyung Bong (2014) -
Strained c:Si0.55Ge0.45 with Embedded e:Si0.75Ge0.25 S/D IFQW SiGe-pFET for DRAM periphery applications
Ritzenthaler, Romain; Schram, Tom; Witters, Liesbeth; Mitard, Jerome; Spessot, Alessio; Caillat, Christian; Hellings, Geert; Eneman, Geert; Aoulaiche, Marc; Na, Hoon Joo; Son, Yunik; Noh, Kyung Bong; Fazan, Pierre; Lee, Sun Ghil; Collaert, Nadine; Mocuta, Anda; Horiguchi, Naoto; Thean, Aaron (2016) -
Thermal budget impact on HKMG Al2O3 and La-based stacks for 2x DRAM periphery transistors
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Na, Hoon Jo; Lee, Sun Ghil; Son, Yunik; Noh, Kyung Bong; Aoulaiche, Marc; Arimura, Hiroaki; Horiguchi, Naoto; Fazan, Pierre; Thean, Aaron (2014) -
Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications
Son, Yunik; Noh, Kyung Bong; Aoulaiche, Marc; Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Fazan, Pierre; Cho, Moon Ju; Franco, Jacopo; Horiguchi, Naoto; Thean, Aaron (2014)