Browsing by author "Verleysen, Eveline"
Now showing items 1-16 of 16
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Characterization of nickel silicides using EELS-based methods
Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Dominique; Vandervorst, Wilfried (2010) -
Characterization of nickel-silicides by HAADF-STEM imaging
Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Dominique; Vandervorst, Wilfried (2010) -
Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES)
Verleysen, Eveline; Richard, Olivier; Bender, Hugo; Schryvers, Dominique; Vandervorst, Wilfried (2008-09) -
Chemical analysis of nickel silicides with high spatial resolution by combined EDS, EELS and ELNES
Verleysen, Eveline; Bender, Hugo; Schryvers, Dominique; Vandervorst, Wilfried (2010) -
Chemical analysis of nickel silicides with high spatial resolution by combined EDS, EELS and ELNES
Verleysen, Eveline; Bender, Hugo; Schryvers, Dominique; Vandervorst, Wilfried (2009) -
Chemical analysis of thin films in electronic devices by analytical transmission electron microscopy methodologies
Verleysen, Eveline (2013-03) -
Compositional characterization of nickel silicides by HAADF-STEM imaging
Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Nick; Vandervorst, Wilfried (2011) -
Compositional characterization of nickel silicides by HAADF-STEM imaging
Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Dominique; Vandervorst, Wilfried (2010) -
Damage in nickel silicides during FIB specimen preparation
Verleysen, Eveline; Bender, Hugo; Favia, Paola; Schryvers, Dominique; Vandervorst, Wilfried (2011) -
Epitaxial growth of hexagonal theta-nickel silicide on (001) Si
Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Nick; De Keyser, Koen; Detavernier, Christophe; Vandervorst, Wilfried (2010) -
Experimental determination of inelastic mean free paths for calculation of TEM specimen thickness
Verleysen, Eveline; Bender, Hugo; Schryvers, Dominique; Vandervorst, Wilfried (2011) -
Ni(Pt)Si thermal stability improvement by carbon implantation
Mertens, Sofie; Hoffmann, Thomas Y.; Vrancken, Christa; Jakschik, Stefan; Richard, Olivier; Verleysen, Eveline; Bender, Hugo; Zhao, Chao; Vandervorst, Wilfried; Absil, Philippe; Lauwers, Anne (2008) -
Oxidation behavior of Ni thin films: application to NiO-based ReRAM
Lisoni, Judit; Goux, Ludovic; Verleysen, Eveline; Wang, Xin Peng; Jurczak, Gosia; Wouters, Dirk (2009) -
Phase formation and thermal stability of ultrathin nickel-silicides on Si(100)
De Keyser, K.; Van Bockstael, C.; Van Meirhaeghe, R.L.; Detavernier, C.; Verleysen, Eveline; Bender, Hugo; Vandervorst, Wilfried; Jordan-Sweet, J.; Lavoie, C. (2010) -
Silicide yield improvement with NiPtSi formation by laser anneal for advanced low power platform CMOS technology
Ortolland, Claude; Rosseel, Erik; Horiguchi, Naoto; Kerner, Christoph; Mertens, Sofie; Kittl, Jorge; Verleysen, Eveline; Bender, Hugo; Vandervorst, Wilfried; Lauwers, Anne; Absil, Philippe; Biesemans, Serge; Mathukrishnan, S.; Srinivasan, S.; Mayur, A.J.; Schreutelkamp, Rob; Hoffmann, Thomas Y. (2009) -
TEM analysis in semiconductor industry: R&D examples of future needs
Richard, Olivier; Geypen, Jef; Favia, Paola; Verleysen, Eveline; Marrant, Koen; Van Marcke, Patricia; Bender, Hugo (2010)