Browsing by imec author "4fe93ec5f1ee5c84df79a850485b973ec41d19e5"
Now showing items 41-60 of 241
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Characterization of organic solar cell materials by G-SIMS
Franquet, Alexis; Conard, Thierry; Voroshazi, Eszter; Poleunis, Claude; Cheyns, David; Vandervorst, Wilfried (2013) -
Characterization of post-etch photoresists used in metal hardmask and photoresist mask patterning schemes
Kesters, Els; Claes, Martine; Lux, Marcel; Le, Quoc Toan; Vereecke, Guy; Franquet, Alexis; Conard, Thierry; Mertens, Paul; Adriaensens, Peter; Carleer, Robert; Biebuyck, J.J.; Van Veltem, P.; Bebelman, Sabine (2007) -
Characterization of post-etched photoresist and residues by various analytical techniques
Franquet, Alexis; Claes, Martine; Conard, Thierry; Kesters, Els; Vereecke, Guy; Vandervorst, Wilfried (2007-11) -
Characterization of post-etched photoresist and residues by various analytical techniques
Franquet, Alexis; Claes, Martine; Conard, Thierry; Kesters, Els; Vereecke, Guy; Vandervorst, Wilfried (2008) -
Characterization of the conductive structures in the periplasm of cable bacteria using combined TOF-SIMS/AFM
Thiruvallur Eachambadi, Raghavendran; Boschker, Henricus; Franquet, Alexis; Spampinato, Valentina; Hildalgo-Martinez, Silvia; Meysman, Filip; Manca, Jean (2018) -
Chemical and structural modifications in a 193-nm photoresist after low-k dry etch
Kesters, Els; Claes, Martine; Le, Quoc Toan; Lux, Marcel; Franquet, Alexis; Vereecke, Guy; Mertens, Paul; Frank, Martin M.; Carleer, Robert; Adriaensens, Peter; Biebuyck, J.J.; Bebelman, Sabine (2008) -
Chemical contributions of low-energy ion beams towards ripple formation: A mixed beam experimental study
Sarkar, Subhendu; Franquet, Alexis; Moussa, Alain; Vandervorst, Wilfried (2008) -
Chemical effects during ripple formation with isobaric ion beams
Sarkar, Sou; Franquet, Alexis; Moussa, Alain; Vandervorst, Wilfried (2011-05) -
CNT EUV pellicle tunability and performance in a scanner-like environment
Timmermans, Marina; Pollentier, Ivan; Korytov, Maxim; Nuytten, Thomas; Sergeant, Stefanie; Conard, Thierry; Meersschaut, Johan; Zhang, Yide; Dialameh, Masoud; Alaerts, Wilfried; Jazaeri, Ehsan; Spampinato, Valentina; Franquet, Alexis; Brems, Steven; Huyghebaert, Cedric; Gallagher, Emily (2021) -
Co active electrode enhances CBRAM performance and scaling potential
Belmonte, Attilio; Radhakrishnan, Janaki; Donadio, Gabriele Luca; Redolfi, Augusto; Delhougne, Romain; Nyns, Laura; Covello, Angelo; Vereecke, Guy; Franquet, Alexis; Spampinato, Valentina; Kundu, Shreya; Mao, Ming; Goux, Ludovic; Kar, Gouri Sankar (2019) -
[Co/Ni]-CoFeB hybrid free layer stack materials for high density magnetic random access memory applications
Liu, Enlong; Swerts, Johan; Couet, Sebastien; Mertens, Sofie; Tomczak, Yoann; Lin, Tsann; Spampinato, Valentina; Franquet, Alexis; Van Elshocht, Sven; Kar, Gouri Sankar; Furnemont, Arnaud; De Boeck, Jo (2016) -
Combined AFM and ToF-SIMS analyses for the study of filaments in organic resistive switching memories
Busby, Yan; Franquet, Alexis; Spampinato, Valentina; Casula, Giulia; Bonfiglio, Annalisa; Cosseddu, Piero; Pireaux, Jean-Pireaux; Houssiau, Laurent (2018) -
Combined effect of high temperature annealing and hydrogenation of a deposited silicon oxide for silicon surface passivation
Loozen, Xavier; Jivanescu, M.; Stesmans, Andre; Choulat, Patrick; John, Joachim; Conard, Thierry; Franquet, Alexis; Beaucarne, Guy; Van Kerschaver, Emmanuel (2009) -
Combined in-situ scanning force microscopy/TOFSIMS and FIB-TOFSIMS analysis: towards 3D chemical analysis
Conard, Thierry; Franquet, Alexis; Spampinato, Valentina; Op de Beeck, Jonathan; Celano, Umberto; Vandervorst, Wilfried; Moeler, Rudolf; Labyedh, Nouha; Vereecken, Philippe (2017) -
Combined TOF-SIMS/SPM characterization of the electron conductive structures in centimeter long and filamentous Cable Bacteria
Thiruvallur Eachambadi, Raghavendran; Boschker, Henricus; Franquet, Alexis; Spampinato, Valentina; Hidalgo-Martinez, Silvia; Meysman, Filip; Manca, Jean (2019) -
Composition analysis of III-V materials grown in nanostructures for semiconductor applications: the self focusing SIMS approach
Franquet, Alexis; Douhard, Bastien; Merckling, Clement; Conard, Thierry; Vandervorst, Wilfried (2015) -
Composition analysis of III-V materials grown in nanostructures: the self-focusing SIMS approach
Franquet, Alexis; Douhard, Bastien; Conard, Thierry; Melkonyan, Davit; Vandervorst, Wilfried (2016) -
Composition measurements of thin films beyond the spatial resolution of SIMS
Franquet, Alexis; Douhard, Bastien; Delmotte, Joris; Merckling, Clement; Conard, Thierry; Vandervorst, Wilfried (2013) -
Composition quantification of microelectronics multilayer thin films by EDX: toward small scale analysis
Conard, Thierry; Arstila, Kai; Hantschel, Thomas; Franquet, Alexis; Vandervorst, Wilfried; Vecchio, Emma; Bauer, Frank; Burgess, Simon (2009) -
Compositional depth profiling of TaCN thin films
Adelmann, Christoph; Conard, Thierry; Franquet, Alexis; Brijs, Bert; Munnik, Frans; Burgess, Simon; Witters, Thomas; Meersschaut, Johan; Kittl, Jorge; Vandervorst, Wilfried; Van Elshocht, Sven (2012)