Browsing by author "O'Neill, A.G."
Now showing items 1-7 of 7
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1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack
Yan, L.; Simoen, Eddy; Olsen, S.H.; Akheyar, Amal; Claeys, Cor; O'Neill, A.G. (2009) -
Application of a nano-mechanical sensor to monitor stress in copper damascene interconnects
Wilson, Chris; Croes, Kristof; Tokei, Zsolt; Vereecke, Bart; Beyer, Gerald; O'Neill, A.G.; Horsfall, A.B. (2009) -
In-situ growth of Cu-Mn alloy self-forming barriers in 100 nm Cu/Low-k damascene interconnects
Wilson, Chris; Volders, Henny; Tokei, Zsolt; Croes, Kristof; Pantouvaki, Marianna; Beyer, Gerald; Horsfall, A.B.; O'Neill, A.G. (2009) -
Quantifying self-heating effects with scaling in globally strained Si MOSFETS
Agaiby, R.; Yang, Y.; Olsen, S.H.; O'Neill, A.G.; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor (2007) -
Strained Si/SiGe MOS technology
Olsen, S.; Yan, L.; Agaiby, R.; Escobedo-Cousin, E.; O'Neill, A.G.; Hellstrom, P.-E.; Ostling, M.; Lyutovich, L.; Kasper, E.; Claeys, Cor; Parker, E.H.C. (2007) -
Synchrotron measurement of the effect of line-width scaling on stress in advanced Cu/Low-k interconnects
Wilson, Chris; Croes, Kristof; Zhao, Chao; Metzger, T.H.; Zhao, Larry; Beyer, Gerald; Horsfall, A.B.; O'Neill, A.G.; Tokei, Zsolt (2009) -
Thermal stability of supercritical thickness-strained Si layers on thin strain-relaxed buffers
Escobedo-Cousin, E.; Olsen, S.H.; Dobrosz, P.; Bull, S.J.; O'Neill, A.G.; Coulson, H.; Claeys, Cor; Loo, Roger; Delhougne, Romain; Caymax, Matty (2007)