Browsing by author "Mannarino, Manuel"
Now showing items 1-16 of 16
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A 3D electrical characterization of single stacking faults in InP by conductive-AFM
Mannarino, Manuel; Celano, Umberto; Lu, Augustin; Chintala, Ravi Chandra; Paredis, Kristof; Vandervorst, Wilfried (2015) -
A novel approach of using STM and NC-AFM to study narrow trenches in an oxide matrix
Mannarino, Manuel; Chintala, Ravi Chandra; Eyben, Pierre; Vandervorst, Wilfried (2014) -
A versatile LPCVD silicon nitride platform for heterogenous photonic circuits: Ultra tight thickness control and low propagation loss
Helin, Philippe; Firrincieli, Andrea; Ray Chaudhuri, Ashesh; Pham, Nga; Lenci, Silvia; Mannarino, Manuel; Osman, Haris (2019) -
Characterization of InP growth in nm-sized trenches by a combination of NC-AFM and STM
Mannarino, Manuel; Eyben, Pierre; Chintala, Ravi Chandra; Merckling, Clement; van Dorp, Dennis; Vandervorst, Wilfried (2014) -
Combining UHV AFM and SEM for high resolution, repeatable and low noise scanning spreading resistance microscopy
Eyben, Pierre; Chintala, Ravi Chandra; Mannarino, Manuel; Nazir, Aftab; Schulze, Andreas; Vandervorst, Wilfried (2013) -
Controlled sulfurization process for the synthesis of large area MoS2 films and MoS2-WS2 heterostructures
Chiappe, Daniele; Asselberghs, Inge; Sutar, Surajit; Iacovo, Serena; Afanasiev, Valeri; Stesmans, Andre; Balaji, Yashwanth; Peters, Lisanne; Heyne, Markus; Mannarino, Manuel; Vandervorst, Wilfried; Sayan, Safak; Huyghebaert, Cedric; Caymax, Matty; Heyns, Marc; De Gendt, Stefan; Radu, Iuliana; Thean, Aaron (2016) -
Damage-free contact mode current sensing SPM: benchmarking PFTUNA vs. C-AFM
Celano, Umberto; Chintala, Ravi Chandra; Hoflijk, Ilse; Moussa, Alain; Vanhaeren, Danielle; Mannarino, Manuel; Nazir, Aftab; Eyben, Pierre; Vandervorst, Wilfried (2013) -
Effect of inductively coupled electro-magnetic field on bottom oxide etch in a high aspect ratio trench
Sardo, Stefano; Palombizio, Antonio; Redolfi, Augusto; Mannarino, Manuel (2020) -
Effect of inductively coupled electro-magnetic field on bottom oxide etch in a high aspect ratio trench
Sardo, Stefano; Palombizio, Antonio; Redolfi, Augusto; Mannarino, Manuel; Haspeslagh, Luc (2020) -
Epitaxial defects in nanoscale InP Fin structures revealed by wet-chemical etching
van Dorp, Dennis; Mannarino, Manuel; Arnauts, Sophia; Bender, Hugo; Merckling, Clement; Moussa, Alain; Vandervorst, Wilfried; Schulze, Andreas (2017) -
Nanoscopic analysis of electrical and structural properties in III-V materials and devices
Mannarino, Manuel (2018-05) -
Nucleation and growth mechanisms of Al2O3 ALD on synthetic polycrystalline MoS2
Zhang, Haodong; Chiappe, Daniele; Meersschaut, Johan; Conard, Thierry; Franquet, Alexis; Nuytten, Thomas; Mannarino, Manuel; Radu, Iuliana; Vandervorst, Wilfried; Delabie, Annelies (2017) -
Self-controlled constant-current temperature stress for triangular voltage sweep measurements of Cu
Ciofi, Ivan; Mannarino, Manuel; Li, Yunlong; Croes, Kristof; Beyer, Gerald (2011) -
Self-controlled constant-current temperature stress for triangular voltage sweep measurements of Cu
Ciofi, Ivan; Mannarino, Manuel; Li, Yunlong; Croes, Kristof; Beyer, Gerald (2012) -
Silicon nitride photonic platform for sensing applications
Helin, Philippe; Pham, Nga; Lenci, Silvia; Ray Chaudhuri, Ashesh; Firrincieli, Andrea; Mannarino, Manuel (2019) -
Surface characterization of InP trenches embedded in oxide using scanning probe microscopy
Mannarino, Manuel; Chintala, Ravi Chandra; Moussa, Alain; Merckling, Clement; Eyben, Pierre; Paredis, Kristof; Vandervorst, Wilfried (2015)