Browsing by author "Nicolaides, Lena"

Advances in optical carrier profiling through high-frequency modulated optical reflectance

Bogdanowicz, Janusz; Dortu, Fabian; Clarysse, Trudo; Vandervorst, Wilfried; Shaughnessy, Derrick; Salnick, Alex; Nicolaides, Lena; Opsal, Jon (2007)

Advances in optical carrier profiling through high-frequency modulated optical reflectance

Bogdanowicz, Janusz; Dortu, Fabian; Clarysse, Trudo; Vandervorst, Wilfried; Shaughnessy, Derrick; Salnick, Alex; Nicolaides, Lena; Opsal, Jon (2008)

Impact of inactive dopants in chemical vapor deposition layers on photomodulated optical reflectance

Bogdanowicz, Janusz; Dortu, Fabian; Clarysse, Trudo; Vandervorst, Wilfried; Shaughnessy, Derrick; Salnick, Alex; Nicolaides, Lena (2008)

Impact of inactive dopants in chemical vapor deposition layers on photomodulated optical reflectance

Bogdanowicz, Janusz; Dortu, Fabian; Clarysse, Trudo; Vandervorst, Wilfried; Shaughnessy, Derrick; Salnick, Alex; Nicolaides, Lena (2008)

Monitoring of local and global temperature non-uniformities by means of Therma-Probe and Micro Four-Point Probe metrology

Rosseel, Erik; Petersen, Dirch; Osterberg, Frederik; Hansen, Ole; Bogdanowicz, Janusz; Clarysse, Trudo; Vandervorst, Wilfried; Ortolland, Claude; Hoffmann, Thomas Y.; Chan, Philip; Salnik, Alex; Nicolaides, Lena (2009)

Non-destructive extraction of junction depths of active doping profiles from photomodulated optical reflectance offset curves

Bogdanowicz, Janusz; Dortu, Fabian; Clarysse, Trudo; Vandervorst, Wilfried; Rosseel, Erik; Nguyen, Duy; Shaughnessy, Derrick; Salnick, Alex; Nicolaides, Lena (2009)

Nondestructive extraction of junction depths of active doping profiles from photomodulated optical reflectance offset curves

Bogdanowicz, Janusz; Dortu, Fabian; Clarysse, Trudo; Vandervorst, Wilfried; Rosseel, Erik; Nguyen, Duy; Shaughnessy, Derrick; Salnick, Alex; Nicolaides, Lena (2010)